Fei Company competitive analysis

Explore patent oppositions filed by Fei Company against competitors, revealing strategic technology disputes and market positioning.

Last updated on: Aug 20, 2026
Patent NumberTitleApplicantOpposition Date
Charged Particle Beam Apparatus And Control Method Of Charged Particle Beam ApparatusJEOLFeb 7, 2022

Explore Fei Company's recently opposed patents, revealing key competitive challenges and strategic patent disputes in the industry. Track oppositions filed by competitors to understand technology battlegrounds and assess potential risks.

Last updated on: Aug 20, 2026
Patent NumberPublication DateTitleTotal Oppositions
Aug 6, 2025Automated Peak And Baseline Generation For Chromatogram Data1
Aug 21, 2019Clustering Of Multi-Modal Data2
Jul 10, 2019Novel Acquisition And Processing Of Data In A Tomographic Imaging Apparatus2
Jul 4, 2018Focused Ion Beam Low Kv Enhancement1

Latest PTAB cases involving Fei Company

Discover the latest PTAB cases involving Fei Company, highlighting their recent legal challenges and patent disputes.

Peer Comparison New

IP litigation analysis comparing Fei Company with top 3 competitors. Includes complete PTAB case data and opposition data from 2018 onwards.

Last updated on: Aug 20, 2026
CompanyOppositions FiledOppositions FacedPTAB Cases FiledPTAB Cases Faced
FEI16 - -
CARL ZEISS7154315
CARL ZEISS MICROSCOPY15 - 1 -
CARL ZEISS X RAY MICROSCOPY1 - - 1