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Device For Inspecting A Sample Comprising A Microscope - EP2336817

The patent EP2336817 was granted to Leica Microsystems CMS on Aug 16, 2023. The application was originally filed on Dec 7, 2010 under application number EP10193888A. The patent is currently recorded with a legal status of "Patent Maintained As Amended".

EP2336817

LEICA MICROSYSTEMS CMS
Application Number
EP10193888A
Filing Date
Dec 7, 2010
Status
Patent Maintained As Amended
Jul 14, 2023
Publication Date
Aug 16, 2023
External Links
Slate, Register, Google Patents

Patent Summary

Patent Family

Patent Family

Patent Oppositions

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CARL ZEISSMar 17, 2021LORITZADMISSIBLE

Patent Citations (8) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
OPPOSITIONDE102007024074
SEARCHDE102007024074
SEARCHEP1094308
SEARCHEP1691180
SEARCHUS2005042428
SEARCHUS2007114362
SEARCHUS2007206276
SEARCHUS2008192231

Dossier Documents

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