IP Verse

A System And Method For Operating Rfid Devices On Single-Use Connectors - EP2382582

The patent EP2382582 was granted to GE Healthcare Biocience BIO Process on May 3, 2017. The application was originally filed on Jan 28, 2010 under application number EP10736103A. The patent is currently recorded with a legal status of "Revoked".

EP2382582

GE HEALTHCARE BIOCIENCE BIO PROCESS
Application Number
EP10736103A
Filing Date
Jan 28, 2010
Status
Revoked
Feb 18, 2025
Publication Date
May 3, 2017
External Links
Slate, Register, Google Patents

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SARTORIUS STEDIM BIOTECHFeb 2, 2018PRINZ & PARTNER MBBADMISSIBLE

Patent Citations (38) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
DESCRIPTIONUS5892458
DESCRIPTIONUS6201731
DESCRIPTIONUS6806808
DESCRIPTIONUS6808952
DESCRIPTIONUS7135977
DESCRIPTIONUS7195149
DESCRIPTIONUS7328837
INTERNATIONAL-SEARCH-REPORTEP1887581
INTERNATIONAL-SEARCH-REPORTUS2007109103
INTERNATIONAL-SEARCH-REPORTUS2007249901
INTERNATIONAL-SEARCH-REPORTUS2008024310
INTERNATIONAL-SEARCH-REPORTUS2008282026
INTERNATIONAL-SEARCH-REPORTUS2009256679
INTERNATIONAL-SEARCH-REPORTUS2009273447
INTERNATIONAL-SEARCH-REPORTUS7382255
INTERNATIONAL-SEARCH-REPORTWO2009120231
OPPOSITIONDE102007003594
OPPOSITIONEP1576971
OPPOSITIONEP1998096
OPPOSITIONUS2007249901
OPPOSITIONUS2008024310
OPPOSITIONUS2008282026
OPPOSITIONUS2009012449
OPPOSITIONUS7195149
OPPOSITIONUS7382255
OPPOSITIONWO02095675
OPPOSITIONWO03026558
OPPOSITIONWO2004033024
OPPOSITIONWO2009100192
OPPOSITIONWO2009120231
OPPOSITIONWO2010052002
SEARCHDE102007003594
SEARCHEP1576971
SEARCHEP1998096
SEARCHUS2009012449
SEARCHWO03026558
SEARCHWO2009100192
SEARCHWO2010052002

Non-Patent Literature (NPL) Citations (10) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference Text
DESCRIPTION- COIEC, Y M, MUSSEAU, 0., LERAY, J. L, "A study of radiation vulnerability of ferroelectric material and devices", IEEE TRANS. NUCL. SCI., (1994), vol. 41, pages 495 - 502, XP055354861
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DESCRIPTION- KAMP, D. A., DE VILBISS, A. D., PHILPY, S. C., DERBENWICK, G. F., "Adaptable ferroelectric memories for space applications", NON- VOLATILE MEMORY TECHNOLOGY SYMPOSIUM, NVMTS042004, pages 149 - 152
DESCRIPTION- SCHWANK, J. R., NASBY, R. D., MILLER, S. L., RODGERS, M. S., DRESSENDORFER, P. V., "Total-dose radiation-induced degradation of thin film ferroelectric capacitors", IEEE TRANS. NUCL. SCI., (1990), vol. 37, pages 1703 - 1712
DESCRIPTION- SCOTT, J. F., ARAUJO, C. A., MEADOWS, H. B., MCMILLAN, L. D., SHAWABKEH, A., "Radiation effects on ferroelectric thin-film memories: Retention failure mechanisms", J. APPL. PHYS., (1989), vol. 66, pages 1444 - 1453
DESCRIPTION- SCOTT, J. F., PAZ DE ARAUJO, C. A., "Ferroelectric memories", SCIENCE, (1989), vol. 246, pages 1400 - 1405
DESCRIPTION- BENEDETTO, J. M., DELANCEY, W. M., OLDHAM, T R., MCGARRITY, J. M., TIPTON, C. W., BRASSINGTON, M., FISCH, D. E., "Radiation evaluation of commercial ferroelectric nonvolatile memories", IEEE TRANS. NUCL. SCI., (1991), vol. 38, doi:doi:10.1109/23.124125, pages 1410 - 1414, XP055354858
DESCRIPTION- BENEDETTO, J. M., DELANCEY, W. M., OLDHAM, T. R., MCGARRITY, J. M., TIPTON, C. W., BRASSINGTON, M., FISCH, D. E., "Radiation evaluation of commercial ferroelectric nonvolatile memories", IEEE TRANS. NUCL. SCI., (1991), vol. 38, doi:doi:10.1109/23.124125, pages 1410 - 1414, XP055354858
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OPPOSITION- ADAM MELSKI, "Grundlagen und betriebswirtschaftliche Anwendung von RFID", Arbeitsbericht Nr. 11/2006, Georg-August-Universität Göttingen, URL: http://webdoc.sub.gwdg.de/ebook/serien/Im/arbeitsberichte_wi2/2006_11.pdf, XP055461093

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