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Rapid, Non-Destructive, Selective Infrared Spectrometry Analysis Of Organic Coatings On Molded Articles - EP3044568

The patent EP3044568 was granted to SIO Medical Products on Sep 9, 2020. The application was originally filed on Sep 12, 2014 under application number EP14772541A. The patent is currently recorded with a legal status of "Revoked".

EP3044568

SIO MEDICAL PRODUCTS
Application Number
EP14772541A
Filing Date
Sep 12, 2014
Status
Revoked
Jul 30, 2025
Publication Date
Sep 9, 2020
External Links
Slate, Register, Google Patents

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FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EVJun 9, 2021WSL PATENTANWALTE PARTNERSCHAFT MBB -

Patent Citations (7) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
DESCRIPTIONUS7985188
INTERNATIONAL-SEARCH-REPORTUS2010298738
OPPOSITIONDE10060560
OPPOSITIONEP0644412
OPPOSITIONUS2010298738
OPPOSITIONUS8067070
OPPOSITIONWO2013071138

Non-Patent Literature (NPL) Citations (10) New

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Citation PhaseReference Text
INTERNATIONAL-SEARCH-REPORT- JIMMY A BESTER ET AL, "IR-karakterisering van dun soliede SiOxCy-lagies [IR characterization of SiOxCy thin solid films]", SOUTH-AFRICAN JOURNAL OF CHEMISTRY/ SUID-AFRIKAANSE TIDSKRIFVIR CHEMIE, PRETORIA, SOUTH AFRICA, (19950101), vol. 48, no. 3/4, ISSN 0379-4350, pages 108 - 113, XP008174447 [X] 1,4,6,8 * abstract * [Y] 10,14 [I] 2,3,5,7,9,11-13,15-29
INTERNATIONAL-SEARCH-REPORT- INNOCENZI P, "Infrared spectroscopy of sol-gel derived silica-based films: a spectra-microstructure overview", JOURNAL OF NON-CRYSTALLINE SOLIDS, NORTH-HOLLAND PHYSICS PUBLISHING. AMSTERDAM, NL, (20030201), vol. 316, no. 2-3, doi:10.1016/S0022-3093(02)01637-X, ISSN 0022-3093, pages 309 - 319, XP004402052 [X] 6 * paragraphs [0003] , [0004]; figures 3,4 * [I] 7,8
OPPOSITION- H.-H. PERKAMPUS, "INSTRUMENTAL LINE WIDTH", Encyclopedia of Spectroscopy, Weinheim, (19950000), ISBN 3-527-29281-0, XP055818984
OPPOSITION- HUNG-EN TU et al., "Low-k SiCxNy Films Prepared by Plasma-Enhanced Chemical Vapor Deposition Using 1,3,5-trimethyl-1,3,5-trivinylcyclotrisilazane Precursor", Journal of The Electrochemical Society, (20120000), vol. 159, no. 5, pages G56 - G61, XP055818976
OPPOSITION- JIMMY A. BESTER et al., "IR-karakterisering van dun soliede SiOxCy-lagies [IR charac- terization of SiOxCy thin solid films", SOUTH-AFRICAN JOURNAL O F CHEMISTRY, XP008174447
OPPOSITION- P. A. ROSENTHAL et al., "Infrared Analysis of Advanced Thin Film Materials", JOM -e, vol. 52, no. 10, (20000000), URL: http://www.tms.org/pubs/journals/ JOM /0010/Rosenthal/Rosenthal-0010.html, XP002409353
OPPOSITION- SMITH, BRIAN C., "Fundamentals of Fourier transform infrared spectroscopy", Fundamentals of Fourier Transform Infrared Spectroscopy, Boca Raton, (20110000), ISBN 9781420069297, XP055818993
OPPOSITION- SUID-AFRIKAANSE TIDSKRIFVIR CHEMIE, PRETORIA, SOUTH AFRICA, (19950101), vol. 48, no. 3, ISSN 0379-4350, pages 108 - 113, XP008174447
OPPOSITION- UWE KAHLER, "Darstellung, Charakterisierung und Oberflähenmodifizie- rung von Siliziumnanopartikeln in SiO2", Dissertation, Halle-Wittenberg, (20010200), XP055818997
OPPOSITION- MATSUURA et al., "Flexible Fiber-Optics Probes for Raman and FT-IR Remote Spectros- copy", IEEE Journal of selected topics in quantum electronics, (20071100), vol. 13, no. 6, pages 1704 - 1708, XP011198945

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