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Predictive Monitoring And Diagnostics Systems And Methods - EP3171239

The patent EP3171239 was granted to Rockwell Automation on Aug 10, 2022. The application was originally filed on Nov 17, 2016 under application number EP16199319A. The patent is currently recorded with a legal status of "Patent Maintained As Amended".

EP3171239

ROCKWELL AUTOMATION
Application Number
EP16199319A
Filing Date
Nov 17, 2016
Status
Patent Maintained As Amended
Jul 8, 2022
Publication Date
Aug 10, 2022
External Links
Slate, Register, Google Patents

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FESTOJul 16, 2020PATENTANWALTE MAGENBAUER & KOLLEGEN PARTNERSCHAFT MBBADMISSIBLE

Patent Citations (3) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
OPPOSITIONUS2007174225
OPPOSITIONUS2012316835
OPPOSITIONUS2014039834

Non-Patent Literature (NPL) Citations (11) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference Text
OPPOSITION- Bator, "Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis", Workshop Computational Intelligence, (20120101), pages 163 - 177
OPPOSITION- Bator, "Feature Extraction and Reduction Applied to Sensorless Drive Diagnosis", Workshop Computational Intelligence, (20120101), pages 163 - 177, XP055786207
OPPOSITION- DU R et al., "AUTOMATED MONITORING OF MANUFACTURING PRO- CESSES, PART 1: MONITORING METHODS", TRANSACTIONS OF THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS,SERIES B: JOUR- NAL OF ENGINEERING FOR INDUSTRY, ASME, NEW YORK, US, (19950501), vol. 117, no. 2, pages 121 - 132, XP000521507
OPPOSITION- J.V. Ringwood et al, "Estimation and Control in Semiconductor Etch: Practice and Possibilities", IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING., IEEE SERVICE CENTER, PISCATAWAY, NJ., US, US, (20100201), vol. 22, no. 1, ISSN 0894-6507, pages 87 - 98, XP011286466
OPPOSITION- WORDEN K et al., "Natural computing for mechanical systems research: A tu- torial overview", MECHANICAL SYSTEMS AND SIGNAL PROCESSING, AMSTERDAM, NL, (20101120), vol. 25, no. 1, pages 4 - 111, XP027510319
OPPOSITION- Monks Uwe; Lohweg Volker, "Machine conditioning by importance controlled information fusion", 2013 IEEE 18th Conference on Emerging Technologies & Factory Automation (ETFA), IEEE, (20130910), doi:10.1109/ETFA.2013.6647984, ISSN 1946-0740, pages 1 - 8, XP032516956
OPPOSITION- DAI XUEWU et al., "From Model, Signal to Knowledge: A Data-Driven Per- spective of Fault Detection and Diagnosis", IEEE TRANSACTIONS ON INDUS- TRIAL INFORMATICS, NEW YORK, NY, US, (20131014), vol. 9, no. 4, pages 2226 - 2238, XP011530597
OPPOSITION- Dong Shaojiang et al, "A Fault Diagnosis Method for Rotating Machinery Based on PCA and Morlet Kernel SVM", Mathematical problems in engineering, Gordon and breach publishers , Basel, CH, CH, (20140101), vol. 2014, doi:10.1155/2014/293878, ISSN 1024-123X, pages 1 - 8, XP055786218
SEARCH- DU R ET AL, "AUTOMATED MONITORING OF MANUFACTURING PROCESSES, PART 1: MONITORING METHODS", TRANSACTIONS OF THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS,SERIES B: JOURNAL OF ENGINEERING FOR INDUSTRY, ASME. NEW YORK, US, (19950501), vol. 117, no. 2, ISSN 0022-0817, pages 121 - 132, XP000521507 [T] 1-15 * the whole document *
SEARCH- WORDEN K ET AL, "Natural computing for mechanical systems research: A tutorial overview", MECHANICAL SYSTEMS AND SIGNAL PROCESSING, ELSEVIER, AMSTERDAM, NL, vol. 25, no. 1, doi:10.1016/J.YMSSP.2010.07.013, ISSN 0888-3270, (20110101), pages 4 - 111, (20101120), XP027510319 [T] 1-15 * the whole document *
SEARCH- DAI XUEWU ET AL, "From Model, Signal to Knowledge: A Data-Driven Perspective of Fault Detection and Diagnosis", IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, IEEE SERVICE CENTER, NEW YORK, NY, US, vol. 9, no. 4, doi:10.1109/TII.2013.2243743, ISSN 1551-3203, (20131101), pages 2226 - 2238, (20131014), XP011530597 [I] 1-15 * Sections IV-C, V-B and VI-B *

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