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Sample Transfer Device - EP3247987

The patent EP3247987 was granted to Leica Mikrosysteme on Oct 25, 2023. The application was originally filed on Jan 14, 2016 under application number EP16700591A. The patent is currently recorded with a legal status of "Patent Maintained As Amended".

EP3247987

LEICA MIKROSYSTEME
Application Number
EP16700591A
Filing Date
Jan 14, 2016
Status
Patent Maintained As Amended
Sep 22, 2023
Grant Date
Oct 25, 2023
External Links
Slate, Register, Google Patents

Patent Summary

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QUORUMJun 2, 2021GREAVES BREWSTERADMISSIBLE

Patent Citations (18) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication NumberPublication Link
INTERNATIONAL-SEARCH-REPORTUS2009078060
OPPOSITIONEP1852888
OPPOSITIONEP3175218
OPPOSITIONJP2013257148
OPPOSITIONUS2009242795
OPPOSITIONUS2011027876
OPPOSITIONUS2012024086
OPPOSITIONUS2012027086
OPPOSITIONUS2015340199
OPPOSITIONUS4833330
OPPOSITIONUS4950901
OPPOSITIONUS7644637
OPPOSITIONUS8440982
OPPOSITIONWO0211174
OPPOSITIONWO2009116696
OPPOSITIONWO2009145377
OPPOSITIONWO2014002700
OPPOSITIONWO2016016001

Non-Patent Literature (NPL) Citations (2) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference TextLink
INTERNATIONAL-SEARCH-REPORT- CHYONGERE HSIEH ET AL, "Practical workflow for cryo focused-ion-beam milling of tissues and cells for cryo-TEM tomography", JOURNAL OF STRUCTURAL BIOLOGY, (20131106), vol. 185, no. 1, doi:10.1016/j.jsb.2013.10.019, ISSN 1047-8477, pages 32 - 41, XP055211969 [A] 1-18 * figures 5,8 * * 2.4 Cryo-transfer at the FIB-SEM pages 34-36 * * 2.7 Cryo-transfer to the TEM pages 37-38 *
OPPOSITION- L. Michalski, K. Eckersdorf, J. Kucharski, J. Mcghee, "Temperature Measurement Second Edition /Passage/", Temperature Measurement Second Edition, John Wiley & Sons, Ltd.,, (20010101), pages 2pp, v - x, xiii, XP055954506-

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