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Method And Device For Examination Of A Sample - EP3283917

The patent EP3283917 was granted to Leica Microsystems CMS on Nov 30, 2022. The application was originally filed on Apr 13, 2016 under application number EP16719278A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP3283917

LEICA MICROSYSTEMS CMS
Application Number
EP16719278A
Filing Date
Apr 13, 2016
Status
Granted And Under Opposition
Oct 28, 2022
Publication Date
Nov 30, 2022
External Links
Slate, Register, Google Patents

Patent Summary

Patent Family

Patent Family

Patent Oppositions

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CARL ZEISSAug 30, 2023MEYERADMISSIBLE

Patent Citations (9) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
EXAMINATIONDE10257423
INTERNATIONAL-SEARCH-REPORTDE102007017598
INTERNATIONAL-SEARCH-REPORTDE102011000835
INTERNATIONAL-SEARCH-REPORTUS2011084217
INTERNATIONAL-SEARCH-REPORTUS2011115895
OPPOSITIONDE102007017598
OPPOSITIONDE102009044983
OPPOSITIONEP1787157
OPPOSITIONUS2011115895

Dossier Documents

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    Description

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