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Method For Compensating Detector Pulse Pile-Up Effects In Time-Correlated Single-Photon Counting Applications - EP3431967

The patent EP3431967 was granted to Picoquant Innovations on Jun 7, 2023. The application was originally filed on Jul 19, 2017 under application number EP17182210A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP3431967

PICOQUANT INNOVATIONS
Application Number
EP17182210A
Filing Date
Jul 19, 2017
Status
Granted And Under Opposition
May 5, 2023
Grant Date
Jun 7, 2023
External Links
Slate, Register, Google Patents

Patent Summary

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LEICA MICROSYSTEMS CMSMar 7, 2024SCHAUMBURG UND PARTNER PATENTANWALTE MBBDEEMED NOT TO HAVE BEEN FILED

Patent Citations (2) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication NumberPublication Link
EXAMINATIONEP3370086
SEARCHWO2010089363

Non-Patent Literature (NPL) Citations (6) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference TextLink
DESCRIPTION- M. PATTING; M. WAHL; P. KAPUSTA; R. ERDMANN, "Dead-time effects in TCSPC data analysis", Proceedings of SPIE, (20070000), vol. 6583, page 658307-
OPPOSITION- S. J. B. REED, "Dead time corrections for X-ray intensity measurements with a Si(Li) detector", Journal of Physics Scientific Instruments, (19720000), vol. 5, pages 994 - 996, XP001432005-
OPPOSITION- Wolfgang Becker, "Frontmatter; THE bh TCSPC HANDBOOK,", Wolfgang Becker, Wolfgang Becker, THE bh TCSPC HANDBOOK, 4th Edition, Time-Correlated Single Photon Counting Modules SPC-130 SPC-134 SPC-140 SPC-144 SPC-150 SPC-154 SPC-630 SPC-730 SPC-830 Multi SPC Software, Becker & Hickl GmbH, (20100501), pages i - xi, XP009556073-
OPPOSITION- M. PATTING et al., "Dead-time effects in TCSPC data analysis", Proceedings of SPIE, (20070000), vol. 6583, doi:10.1117/12.722804, page 658307, XP055413435
SEARCH- REED S J B, "Dead time corrections for x ray intensity measurements with a Si(Li) detector", JOURNAL OF PHYSICSE SCIENTIFIC-INSTRUMENTS,, (19721001), vol. 5, no. 10, pages 994 - 996, XP001432005 [Y] 1-4,6,8-15 * abstarct * * page 994 - page 995; figure 1 *-
SEARCH- COATES, "The correction for photon pile-up in the measurement of radiative lifetimes", JOURNAL OF PHYSICS E. SCIENTIFIC INSTRUMENTS, IOP PUBLISHING, BRISTOL, GB, (19680101), vol. 1, no. 1, doi:10.1088/0022-3735/1/8/437, ISSN 0022-3735, page 878/879, XP002111897 [X] 1,2,15 * the whole document * [A] 3-9 [I] 10-14

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