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Method And System For Measuring Coating Thickness - EP3574283

The patent EP3574283 was granted to Teraview on Dec 27, 2023. The application was originally filed on Jan 26, 2018 under application number EP18704288A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP3574283

TERAVIEW
Application Number
EP18704288A
Filing Date
Jan 26, 2018
Status
Granted And Under Opposition
Nov 24, 2023
Grant Date
Dec 27, 2023
External Links
Slate, Register, Google Patents

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FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EVSep 27, 2024WSL PATENTANWALTE PARTNERSCHAFT MBBADMISSIBLE

Patent Citations (2) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication NumberPublication Link
INTERNATIONAL-SEARCH-REPORTDE102015107616
OPPOSITIONDE102015107616

Non-Patent Literature (NPL) Citations (11) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference TextLink
INTERNATIONAL-SEARCH-REPORT- TETSUO IWATA ET AL, "Prediction of the Thickness of a Thin Paint Film by Applying a Modified Partial-Least-Squares-1 Method to Data Obtained in Terahertz Reflectometry", JOURNAL OF INFRARED, MILLIMETER AND TERAHERTZ WAVES, SPRINGER NEW YORK LLC, US, vol. 34, no. 10, doi:10.1007/S 10762-013-0015-2, ISSN 1866-6892, (20131001), pages 646 - 659, (20130814), XP002722028 [I] 1,2,12-15,18-24,31-43 * abstract * * pages 646-649 * * pages 652-658 *
INTERNATIONAL-SEARCH-REPORT- GREGORY IAN S ET AL, "Extending terahertz paint thickness measurements to advanced industry-standard automotive paint structures", 2016 41ST INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), IEEE, (20160925), doi:10.1109/IRMMW-THZ.2016.7758543, pages 1 - 2, XP033010252 [X] 1-8,11-13,21,31-34,41-43 * the whole document * [I] 9,10,18-20,22-24,35-37,40
INTERNATIONAL-SEARCH-REPORT- SU KE ET AL, "Terahertz Sensor for Non-Contact Thickness and Quality Measurement of Automobile Paints of Varying Complexity", IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY, IEEE, PISCATAWAY, NJ, USA, vol. 4, no. 4, doi:10.1109/TTHZ.2014.2325393, ISSN 2156-342X, (20140701), pages 432 - 439, (20140626), XP011552397 [X] 1,12,31-33,38,39,42 * abstract * * pages 432-435 * [I] 2-11,18-24,34-37,40,41,43
INTERNATIONAL-SEARCH-REPORT- VOLKER K. S. FEIGE ET AL, "Berührungslose Mehrlagen-Schichtdickenmessung industrieller Beschichtungen mittels THz-Messtechnik", TECHNISCHES MESSEN TM., DE, (20120201), vol. 79, no. 2, doi:10.1524/teme.2012.0198, ISSN 0171-8096, pages 87 - 94, XP055466618 [X] 1,12,14,15,42 * the whole document * [I] 2-11,16-24,31-40,43
OPPOSITION- D2a-Auszug aus dem elektronischen Register der Universitätsbibliothek der Technischen Universität Kaiserslautern zum Dokument D2-
OPPOSITION- Krimi Soufienne, "Non-Destructive Terahertz Sensor for In-line Contactless Thickness Measurement and Quality Control of Multilayered Structures", Dissertation, (20150101), pages 1 - 142, XP093229923-
OPPOSITION- TETSUO IWATA, SHUJI VOSHIOKA, SHOTA NAKAMURA, VASUHIRO MIZUTANI, TAKESHI YASUI, "Prediction of the Thickness of a Thin Paint Film by Applying a Modified Partial-Least-Squares-1 Method to Data Obtained in Terahertz Reflectometry", Journal of Infrared, Millimeter and Terahertz Waves, Springer New York LLC, US, US , (20131001), vol. 34, no. 10, doi:10.1007/s 10762-013-0015-2, ISSN 1866-6892, pages 646 - 659, XP002722028
OPPOSITION- Gregory Ian S.; May Robert K.; Taday Philip F.; Mounaix Patrick, "Extending terahertz paint thickness measurements to advanced industry-standard automotive paint structures", 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), IEEE, (20160925), doi:10.1109/IRMMW-THz.2016.7758543, pages 1 - 2, XP033010252
OPPOSITION- Krimi Soufiene, Torosyan Garik, Beigang Rene, "Advanced GPU-Based Terahertz Approach for In-Line Multilayer Thickness Measurements", IEEE Journal of Selected Topics in Quantum Electronics, USA, (20170701), vol. 23, no. 4, doi:10.1109/JSTQE.2016.2646520, ISSN 1077-260X, pages 1 - 12, XP093229914
OPPOSITION- Su Ke; Shen Yao-Chun; Zeitler J. Axel, "Terahertz Sensor for Non-Contact Thickness and Quality Measurement of Automobile Paints of Varying Complexity", IEEE Transactions on Terahertz Science and Technology, IEEE, Piscataway, NJ, USA, Piscataway, NJ, USA , (20140701), vol. 4, no. 4, doi:10.1109/TTHZ.2014.2325393, ISSN 2156-342X, pages 432 - 439, XP011552397
OPPOSITION- Volker K. S. Feige, Milan Berta, Stephan Nix, Frank Ellrich, Joachim Jonuscheit, René Beigang, "Berührungslose Mehrlagen-Schichtdickenmessung industrieller Beschichtungen mittels THz-Messtechnik", tm - Technisches Messen/Plattform für Methoden, Systeme und Anwendungen der Messtechnik, R.OLDENBOURG VERLAG. MUNCHEN., DE, DE , (20120201), vol. 79, no. 2, doi:10.1524/teme.2012.0198, ISSN 0171-8096, pages 87 - 94, XP055466618

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