IP Verse

Method For Optical Measurement Of Weld Depth - EP3901570

The patent EP3901570 was granted to Precitec on Apr 19, 2023. The application was originally filed on Jul 5, 2018 under application number EP21169144A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP3901570

PRECITEC
Application Number
EP21169144A
Filing Date
Jul 5, 2018
Status
Granted And Under Opposition
Mar 17, 2023
Grant Date
Apr 19, 2023
External Links
Slate, Register, Google Patents

Patent Summary

Patent Family

Patent Family

Patent Oppositions

Patent oppositions filed by competitors challenge the validity of a granted patent. These oppositions are typically based on claims of prior art, lack of novelty, or non-obviousness. They are a key part of the process for determining a patent's strength and enforceability.

CompanyOpposition DateRepresentativeOpposition Status

Get instant alerts for new oppositions and patent status changes

IPG LASERJan 12, 2024PETERREINS SCHLEYADMISSIBLE

Patent Citations (14) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication NumberPublication Link
DESCRIPTIONDE10155203
DESCRIPTIONDE102013015656
DESCRIPTIONDE102015012565
OPPOSITIONUS2016039045
OPPOSITIONUS2017052018
OPPOSITIONUS2017087019
OPPOSITIONUS6501551
OPPOSITIONUS7995207
OPPOSITIONUS8214010
OPPOSITIONWO2014138939
OPPOSITIONWO2019025118
SEARCHDE102014007887
SEARCHEP1977850
SEARCHUS2016039045

Non-Patent Literature (NPL) Citations (4) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference TextLink
OPPOSITION- Anonymous, "LaserDepth LD-600 - REAL-TIME MEASUREMENT SYSTEM - APPLICATIONS GUIDE", LaserDepth Dynamics, (20120101), XP093183605-
OPPOSITION- Anonymous, "Using Matlab for Curve Fitting in Junior Lab", MIT Department of Physics, (20040831), MIT Department of Physics, URL: https://web.mit.edu/8.13/matlab/DOCS/fitting-quickstart-OLD.pdf, XP093183606-
OPPOSITION- Webster Paul J.L., Van Vlack Cole, Galbraith Christopher, Wright Logan, Boley Meiko, Ji Yang, Fraser James, "ICI of Laser Materials Processing: Development, Diagnosis and Control", SLPC 2014, (20140101), XP093183611-
SEARCH- KOGEL-HOLLACHER MARKUS ET AL, "Inline measurement for quality control from macro to micro laser applications", PROCEEDINGS OF SPIE; [PROCEEDINGS OF SPIE ISSN 0277-786X VOLUME 10524], SPIE, US, (20170220), vol. 10091, doi:10.1117/12.2255824, ISBN 978-1-5106-1533-5, pages 100910H - 100910H, XP060086447 [I] 1-4,11 * pages 1,3,4,8 - page 9 * [A] 5-10

Download Citation Report

Get a free citation report including examiner, opposition, and international search citations.

Get Citation Report

Dossier Documents

The dossier documents provide a comprehensive record of the patent’s prosecution history - including filings, correspondence, and decisions made by patent offices - and are crucial for understanding the patent’s legal journey and any challenges it may have faced during examination.

  • Date

    Description

  • Get instant alerts for new documents