Determining The Thickness Profile Of Work Products - EP3977048

The patent EP3977048 was granted to John Bean on Jan 24, 2024. The application was originally filed on May 28, 2020 under application number EP20760962A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP3977048

JOHN BEAN
Application Number
EP20760962A
Filing Date
May 28, 2020
Status
Granted And Under Opposition
Dec 22, 2023
Grant Date
Jan 24, 2024
External Links
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MAREL ICELAND EHFOct 22, 2024WITHDRAWN

Patent Citations (16) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication NumberPublication Link
DESCRIPTIONUS2018029246
DESCRIPTIONUS4875254
DESCRIPTIONUS4962568
DESCRIPTIONUS5365186
DESCRIPTIONUS5585603
DESCRIPTIONUS5868056
DESCRIPTIONUS6854590
INTERNATIONAL-SEARCH-REPORTUS2018029246
INTERNATIONAL-SEARCH-REPORTUS5960104
INTERNATIONAL-SEARCH-REPORTWO2017093539
OPPOSITIONUS2018029246
OPPOSITIONUS2019000094
OPPOSITIONUS6370223
OPPOSITIONUS8351672
OPPOSITIONUS8831172
OPPOSITIONWO2007049305

Non-Patent Literature (NPL) Citations (1) New

NPL citations refer to non-patent references such as research papers, articles, or other publications cited during examination or opposition phases.

Citation PhaseReference TextLink
OPPOSITION- Ronald P. Haff, Natsuko Toyofuku, "X-ray detection of defects and contaminants in the food industry", SENSING AND INSTRUMENTATION FOR FOOD QUALITY AND SAFETY, Springer New York LLC, US, US , (20081201), vol. 2, no. 4, doi:10.1007/s11694-008-9059-8, ISSN 1932-7587, pages 262 - 273, XP055370130

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Dossier Documents

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