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Device And Method For Axial Length Measurement Having Expanded Measuring Function In The Anterior Eye Segment - EP2134247

The patent EP2134247 was granted to Carl Zeiss on Dec 6, 2017. The application was filed on Mar 28, 2008 under application number EP08734833A. The patent is currently recorded with a legal status of "Granted And Under Opposition".

EP2134247

CARL ZEISS
Application Number
EP08734833A
Filing Date
Mar 28, 2008
Status
Granted And Under Opposition
Nov 3, 2017
Publication Date
Dec 6, 2017
External Links
Slate, Register, Google Patents

Patent Summary

Patent Family

Patent Family

Patent Oppositions

Patent oppositions filed by competitors challenge the validity of a granted patent. These oppositions are typically based on claims of prior art, lack of novelty, or non-obviousness. They are a key part of the process for determining a patent's strength and enforceability.

CompanyOpposition DateRepresentativeOpposition Status
OCULUS OPTIKGERATESep 5, 2018ADVOTECWITHDRAWN

Patent Citations (24) New

Patent citations refer to prior patents cited during different phases such as opposition or international search.

Citation PhasePublication Number
DESCRIPTIONDD251497
DESCRIPTIONDE19812297
DESCRIPTIONDE19852331
DESCRIPTIONDE19857001
DESCRIPTIONDE29913601U
DESCRIPTIONDE29913602U
DESCRIPTIONDE29913603U
DESCRIPTIONUS2005203422
DESCRIPTIONUS5673096
DESCRIPTIONUS6634751
DESCRIPTIONUS6779891
DESCRIPTIONWO2005077256
EXAMINATIONDE102005026371
EXAMINATIONEP1430829
INTERNATIONAL-SEARCH-REPORTDE19857001
INTERNATIONAL-SEARCH-REPORTUS5493109
INTERNATIONAL-SEARCH-REPORTUS6779891
INTERNATIONAL-SEARCH-REPORTWO2005077256
OPPOSITIONDE19857001
OPPOSITIONEP1731086
OPPOSITIONUS5512965
OPPOSITIONUS6634751
OPPOSITIONWO2005077256
OPPOSITIONWO2008125198

Dossier Documents

The dossier documents provide a comprehensive record of the patent's prosecution history - including filings, correspondence, and decisions made by patent offices - and are crucial for understanding the patent's legal journey and any challenges it may have faced during examination.

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