X-Ray Inspection Device

Patent No. EP2251680 (titled "X-Ray Inspection Device") was filed by Ishida on May 7, 2010. The application was issued on Sep 30, 2020.

Patent Summary

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WIPOTECOct 14, 2015MISCHUNG

Dossier Documents

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EP2251680

ISHIDA
Application Number
EP10162321A
Filing Date
May 7, 2010
Status
Patent Maintained As Amended
Aug 28, 2020
Publication Date
Sep 30, 2020