Testing Method And Device

Patent No. EP2623981 (titled "Testing Method And Device") was filed by Fujifilm on Sep 28, 2011. The application was issued on Apr 20, 2016.

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CompanyOpposition DateRepresentative
BIOMERIEUXJan 20, 2017MURGITROYD

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  • Date

    Description

EP2623981

FUJIFILM
Application Number
EP11828425A
Filing Date
Sep 28, 2011
Status
Revoked
Oct 29, 2021
Publication Date
Apr 20, 2016