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X-Ray Inspection Device

Patent No. EP3260848 (titled "X-Ray Inspection Device") was filed by Ishida on Feb 3, 2016. The application was issued on Jul 10, 2024.

Patent Summary

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WIPOTECApr 10, 2025EDER SCHIESCHKE & PARTNER

Dossier Documents

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EP3260848

ISHIDA
Application Number
EP16752294A
Filing Date
Feb 3, 2016
Status
Granted And Under Opposition
Jun 7, 2024
Publication Date
Jul 10, 2024
External Links
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