IP Verse

X-Ray Inspecting Device

Patent No. EP3524969 (titled "X-Ray Inspecting Device") was filed by System Square on Sep 20, 2017. The application was issued on Aug 21, 2024.

Patent Summary

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Patent Family

Patent Oppositions

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CompanyOpposition DateRepresentative
METTLER TOLEDOMay 20, 2025LEINWEBER & ZIMMERMANN

Dossier Documents

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EP3524969

SYSTEM SQUARE
Application Number
EP17858203A
Filing Date
Sep 20, 2017
Status
Granted And Under Opposition
Jul 19, 2024
Publication Date
Aug 21, 2024
External Links
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