High Efficiency Targeted In Situ Genome-Wide Profiling
Patent No. EP3688157 (titled "High Efficiency Targeted In Situ Genome-Wide Profiling") was filed by Fred Hutchinson Cancer Center on Sep 25, 2018. The application was issued on Apr 27, 2022.
Patent Summary
A method for chromatin profiling that enables the detection of protein-DNA interactions without the need for chromatin immunoprecipitation (ChIP). The method, called CUT&RUN, involves targeting a specific protein of interest with an antibody coupled to a transposase, which then cleaves the surrounding chromatin. The resulting DNA fragments are released into solution and can be sequenced to determine the protein's binding sites. CUT&RUN offers improved specificity and sensitivity compared to traditional ChIP methods, particularly when performed on magnetic beads, and enables the analysis of low-input samples.
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Date
Description
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EP3688157
- Application Number
- EP18858858A
- Filing Date
- Sep 25, 2018
- Status
- Granted And Under Opposition
- Mar 25, 2022
- Publication Date
- Apr 27, 2022
- External Links
- Slate, Register , Google Patents