IP Verse

Method And Device For Determining A Layer Thickness Of A Layer Applied To A Substrate

Patent No. EP3928062 (titled "Method And Device For Determining A Layer Thickness Of A Layer Applied To A Substrate") was filed by Bttger on Feb 18, 2020. The application was issued on Jun 18, 2025.

Patent Summary

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PHOTOTHERMMar 18, 2026MAMMEL UND MASER PATENTANWALTE PARTG MBB

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EP3928062

BTTGER
Application Number
EP20707373A
Filing Date
Feb 18, 2020
Status
Granted And Under Opposition
May 16, 2025
Publication Date
Jun 18, 2025
External Links
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