Defective Pixel Management In Charged Particle Microscopy

Patent No. EP4198576 (titled "Defective Pixel Management In Charged Particle Microscopy") was filed by FEI on Dec 14, 2021. The application was issued on Jun 21, 2023.

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EP4198576

FEI
Application Number
EP21214549A
Filing Date
Dec 14, 2021
Status
Intended To Grant
Jun 4, 2025
Publication Date
Jun 21, 2023