Device And Method For Dielectric Material Characterization
Patent No. EP4317953 (titled "Device And Method For Dielectric Material Characterization") was filed by Stichting Imec Nederland on Jul 17, 2023. The application was issued on Sep 10, 2025.
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EP4317953
- Application Number
- EP23185721A
- Filing Date
- Jul 17, 2023
- Status
- Granted And Under Opposition
- Aug 8, 2025
- Publication Date
- Sep 10, 2025
- External Links
- Slate, Register , Google Patents