3D Processor Having Stacked Integrated Circuit Die

Patent No. US12401010 (titled "3D Processor Having Stacked Integrated Circuit Die") was filed by Bank Of America Na on Sep 14, 2021.

What is this patent about?

’010 is related to the field of three-dimensional integrated circuits, specifically addressing the increasing demand for higher transistor density in microchips. Traditional scaling approaches are reaching their physical limits, creating a need for alternative methods to improve performance and reduce power consumption.

The underlying idea behind ’010 is to vertically stack two or more integrated circuit dies, creating a 3D circuit where circuit blocks on different dies overlap and are electrically connected. This allows for shorter interconnects and higher bandwidth between functional units, such as processor cores and memory, compared to traditional planar designs.

The claims of ’010 focus on a 3D processor circuit comprising a first IC die with a processor core and a second IC die vertically mounted on the first, containing a cache for that core. The dies are connected through a hybrid bond with directly bonded metal contact pads and non-conductive regions, with the processor core electrically connected to the cache through these pads within the overlapping area.

This vertical stacking is achieved through direct bonding , such as hybrid bonding techniques like DBI, which allows for a high density of vertical connections (z-axis wiring) between the dies. These connections facilitate fast and efficient communication between the processor core and its cache, reducing latency and power consumption compared to traditional designs where these components are located on the same die.

By placing the cache directly above the processor core and using high-density vertical interconnects, the invention minimizes the distance signals need to travel, leading to improved performance and reduced power consumption. This approach contrasts with prior solutions that rely on longer, planar interconnects, which introduce greater resistance and capacitance, ultimately limiting performance.

How does this patent fit in bigger picture?

Technical landscape at the time

In the mid-2010s when ’010 was filed, at a time when integrated circuits were commonly being designed with increasing transistor density, stacking multiple dies vertically to create three-dimensional circuits was an area of active development. At that time, forming electrical connections between stacked dies using vertical interconnects was a non-trivial engineering challenge.

Novelty and Inventive Step

The examiner considered prior art (Ikegami et al. in view of Sadaka) but determined that it did not disclose, make obvious, or otherwise suggest the specific structure of the claimed invention, particularly the configuration of the IC dice, processor core, cache, overlapping area, hybrid bond, metal contact pads, and non-conductive regions, as recited in the claims.

Claims

This patent contains 26 claims, with independent claims numbered 1, 15, and 21. The independent claims generally focus on a three-dimensional processor circuit comprising two integrated circuit dies vertically mounted and interconnected via a hybrid bond, with one die containing a processor core and the other a cache. The dependent claims generally elaborate on specific features, configurations, and components of the 3D processor circuit and electronic device.

Key Claim Terms New

Definitions of key terms used in the patent claims.

Term (Source)Support for SpecificationInterpretation
Directly bonded metal contact pads
(Claim 1, Claim 15, Claim 21)
“In the discussion below, the connections that cross bonding layers to electrically connect circuit blocks on different dies are referred to below as z-axis wiring or connections. This is because these connections traverse completely or mostly in the z-axis of the 3D circuit (e.g., because these connections in some embodiments cross the bonding layer(s) in a direction normal or nearly normal to the bonded surface), with the x-y axes of the 3D circuit defining the planar surface of the IC die substrate or interconnect layers.”Metal contact pads that are directly bonded as part of a hybrid bond between two IC dies.
Directly bonded non-conductive regions
(Claim 1, Claim 15, Claim 21)
“The discussion above and below refers to different circuit blocks on different dies overlapping with each other. As illustrated in the figures described below, two circuit blocks on two vertically stacked dies overlap when their horizontal cross sections (i.e., their horizontal footprint) vertically overlap (i.e., have an overlap in the vertical direction).”Non-conductive regions that are directly bonded as part of a hybrid bond between two IC dies.
Hybrid bond
(Claim 1, Claim 15, Claim 21)
“Some embodiments of the invention provide a three-dimensional (3D) circuit that is formed by vertically stacking two or more integrated circuit (IC) dies to at least partially overlap. In this arrangement, several circuit blocks defined on each die (1) overlap with other circuit blocks defined on one or more other dies, and (2) electrically connect to these other circuit blocks through connections that cross one or more bonding layers that bond one or more pairs of dies.”A bond between two IC dies that includes both directly bonded metal contact pads and directly bonded non-conductive regions.
Overlapping area
(Claim 1, Claim 15)
“The discussion above and below refers to different circuit blocks on different dies overlapping with each other. As illustrated in the figures described below, two circuit blocks on two vertically stacked dies overlap when their horizontal cross sections (i.e., their horizontal footprint) vertically overlap (i.e., have an overlap in the vertical direction).”An area where the first cache vertically overlaps with at least a portion of the first processor core.
Vertically overlaps
(Claim 1, Claim 15, Claim 21)
“Some embodiments of the invention provide a three-dimensional (3D) circuit that is formed by vertically stacking two or more integrated circuit (IC) dies to at least partially overlap. In this arrangement, several circuit blocks defined on each die (1) overlap with other circuit blocks defined on one or more other dies, and (2) electrically connect to these other circuit blocks through connections that cross one or more bonding layers that bond one or more pairs of dies.”The horizontal cross sections of two circuit blocks on vertically stacked dies have an overlap in the vertical direction.

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US12401010

BANK OF AMERICA NA
Application Number
US17474917
Filing Date
Sep 14, 2021
Status
Granted
Expiry Date
Jun 24, 2038
External Links
Slate, USPTO, Google Patents