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Maxim Integrated Products Inc. vs In-Depth Test LLC

The detailed information for PTAB case with proceeding number IPR2015-01627 filed by Maxim Integrated Products Inc. against In-Depth Test LLC on Jul 27, 2015. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number: IPR2015-01627
Filing Date: Jul 27, 2015
Petitioner: Maxim Integrated Products Inc.
Respondent: In-Depth Test LLC
Status: Institution Denied
Respondent Application Number: 10154627
Respondent Tech Center: 2800
Respondent Patent Number: 6792373
Institution Decision Date: Jan 29, 2016
Termination Date: Jan 29, 2016

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.

Show Exhibit Documents

Document Name	Filing Date	Category	Filing Party
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Decision - Denying Institution of Inter Partes Review - 37 C.F.R. 42.108	Jan 29, 2016	PAPER	BOARD
Exhibit	Jan 29, 2016	EXHIBIT	BOARD
Patent Owner's Pre-Trial Preliminary Response	Nov 3, 2015	PAPER	PATENT OWNER
UNOPPOSED MOTION FOR ADMISSION PRO HAC VICE OF JULIE S. TURNER	Aug 18, 2015	PAPER	PETITIONER
DECLARATION OF JULIE S. TURNER IN SUPPORT OF UNOPPOSED MOTION FOR ADMISSION PRO HAC VICE	Aug 18, 2015	EXHIBIT	PETITIONER
Related Matters	Aug 17, 2015	PAPER	INDICATES ARTIFACT WAS SUBMITTED ON BEHALF OF POTENTIAL_PATENT OWNER.
Power of Attorney	Aug 17, 2015	PAPER	INDICATES ARTIFACT WAS SUBMITTED ON BEHALF OF POTENTIAL_PATENT OWNER.
Notice of Filing Date Accorded to Petition	Aug 4, 2015	PAPER	BOARD
PETITION FOR INTER PARTES REVIEW	Jul 27, 2015	PAPER	PETITIONER
Power of Attorney	Jul 27, 2015	PAPER	PETITIONER
U.S. Patent No. 6,792,373 to Tabor	Jul 27, 2015	EXHIBIT	PETITIONER
Declaration of Dr. Jacob Abraham	Jul 27, 2015	EXHIBIT	PETITIONER
Curriculum Vitae of Dr. Jacob Abraham	Jul 27, 2015	EXHIBIT	PETITIONER
W. Ponik, Teradyne Inc.	Jul 27, 2015	EXHIBIT	PETITIONER
W. Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ Data, in International Test Conference 2000 Proceedings, at pages 189-198 (Oct. 3, 2000)	Jul 27, 2015	EXHIBIT	PETITIONER
A. Rao, A.P. Jayasumana, and Y.K. Malaiya, Optimal Clustering and Statistical Identification of Defective ICs using IDDQ Testing, Defect Based Testing, 2000, Proceedings (IEEE), 30-35 (Apr. 30, 2000)	Jul 27, 2015	EXHIBIT	PETITIONER
Automotive Electronics Council, Guidelines for Part Average Testing, AEC - Q001-Rev A, October 8, 1998	Jul 27, 2015	EXHIBIT	PETITIONER
Diane K. Michelson, Statistically Calculating Reject Limits at Par-ametric Test, 1997 IEEE/CPMT International Electronics Manufacturing Technology Symposium, pp. 172	Jul 27, 2015	EXHIBIT	PETITIONER
C. Michael Whitney and Leslie Fowler, Motorola's Engineering Data Analysis System	Jul 27, 2015	EXHIBIT	PETITIONER
Robert Trahan and Kevin Dean, A Comprehensive I.C. Yield Analysis System in RS1, 1990 IEEE/SEMI Advanced Manufacturing Conference, pp. 99-103	Jul 27, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,240,329 to Sun	Jul 27, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,598,194 to Madge et al.	Jul 27, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 5,497,381 to O'Donoghue et al.	Jul 27, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 5,240,866 to Friedman et al.	Jul 27, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,366,108	Jul 27, 2015	EXHIBIT	PETITIONER
IEEE, The Authoritative Dictionary of IEEE Standards Terms (7th Ed. 2000)	Jul 27, 2015	EXHIBIT	PETITIONER