Linear Technology Corporation vs In-Depth Test LLC

The detailed information for PTAB case with proceeding number IPR2015-01994 filed by Linear Technology Corporation against In-Depth Test LLC on Sep 28, 2015. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number: IPR2015-01994
Filing Date: Sep 28, 2015
Petitioner: Linear Technology Corporation
Respondent: In-Depth Test LLC
Status: Institution Denied
Respondent Application Number: 10154627
Respondent Tech Center: 2800
Respondent Patent Number: 6792373
Institution Decision Date: Jan 29, 2016
Termination Date: Jan 29, 2016

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.

Show Exhibit Documents

Document Name	Filing Date	Category	Filing Party
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Decision - Denying Institution of Inter Partes Review - 37 C.F.R. 42.108	Jan 29, 2016	PAPER	BOARD
Exhibit	Jan 29, 2016	EXHIBIT	BOARD
In-Depth Test LLC Preliminary Response	Jan 8, 2016	PAPER	PATENT OWNER
Decision - Denying Petitioner's Motion for Joinder under 35 USC 315(c) and 37 CFR 42.22 and 42.122(b) and Request for Shortened Response Time for Patent Owner's Preliminary Response	Oct 20, 2015	PAPER	BOARD
Power of Attorney	Oct 19, 2015	PAPER	INDICATES ARTIFACT WAS SUBMITTED ON BEHALF OF POTENTIAL_PATENT OWNER.
Related Matters	Oct 19, 2015	PAPER	INDICATES ARTIFACT WAS SUBMITTED ON BEHALF OF POTENTIAL_PATENT OWNER.
Notice of Filing Date Accorded to Petition	Oct 8, 2015	PAPER	BOARD
Power of Attorney	Sep 28, 2015	PAPER	PETITIONER
Petition	Sep 28, 2015	PAPER	PETITIONER
Motion for Joinder	Sep 28, 2015	PAPER	PETITIONER
U.S. Patent No. 6,792,373 to Tabor	Sep 28, 2015	EXHIBIT	PETITIONER
Declaration of Dr. Jacob Abraham	Sep 28, 2015	EXHIBIT	PETITIONER
Curriculum Vitae of Dr. Jacob Abraham	Sep 28, 2015	EXHIBIT	PETITIONER
W. Ponik, Teradyne's J957 VLSI Test System - Getting VLSI to the Market on Time, December 1985, pp. 57-62	Sep 28, 2015	EXHIBIT	PETITIONER
W. Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ Data, in International Test Conference 2000 Proceedings, at pages 189-198 (Oct. 3, 2000)	Sep 28, 2015	EXHIBIT	PETITIONER
A. Rao, A.P. Jayasumana, and Y.K. Malaiya, Optimal Clustering and Statistical Identification of Defective IC_s using IDDQ Testing, Defect Based Testing, 2000, Proceedings (IEEE), 30-35 (Apr. 30, 2000)	Sep 28, 2015	EXHIBIT	PETITIONER
Automotive Electronics Council, Guidelines for Part Average Testing, AEC - Q001-Rev A, October 8, 1998	Sep 28, 2015	EXHIBIT	PETITIONER
Diane K. Michelson, Statistically Calculating Reject Limits at Parametric Test, 1997 IEEE/CPMT International Electronics Manufacturing Technology Symposium, pp. 172-177	Sep 28, 2015	EXHIBIT	PETITIONER
C. Michael Whitney and Leslie Fowler, Motorola_s Engineering Data Analysis System - 10 Years of Analytical Techniques, Proceedings of the Twenty-Fifth Annual SAS User's Group International Conference, April 9-12, 2000, paper 44-25	Sep 28, 2015	EXHIBIT	PETITIONER
Robert Trahan and Kevin Dean, A Comprehensive I.C. Yield Analysis System in RS1, 1990 IEEE/SEMI Advanced Manufacturing Conference, pp. 99-103	Sep 28, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,240,329 to Sun	Sep 28, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,598,194 to Madge	Sep 28, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 5,497,381 to O_Donoghue	Sep 28, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 5,240,866 to Friedman	Sep 28, 2015	EXHIBIT	PETITIONER
U.S. Patent No. 6,366,108 (O'Neill)	Sep 28, 2015	EXHIBIT	PETITIONER
IEEE, The Authoritative Dictionary of IEEE Standards Terms (7th Ed. 2000)	Sep 28, 2015	EXHIBIT	PETITIONER