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Taiwan Semiconductor Manufacturing Company Limited vs Godo Kaisha IP Bridge 1

The detailed information for PTAB case with proceeding number IPR2017-01842 filed by Taiwan Semiconductor Manufacturing Company Limited against Godo Kaisha IP Bridge 1 on Jul 26, 2017. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number: IPR2017-01842
Filing Date: Jul 26, 2017
Petitioner: Taiwan Semiconductor Manufacturing Company Limited
Respondent: Godo Kaisha IP Bridge 1
Status: Terminated-Settled
Respondent Application Number: 12170191
Respondent Tech Center: 2800
Respondent Patent Number: 7893501
Institution Decision Date: Feb 6, 2018
Termination Date: Jan 24, 2019

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.

Show Exhibit Documents

Document Name	Filing Date	Category	Filing Party
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Termination Decision Document	Jan 24, 2019	PAPER	BOARD
Hearing Transcript	Oct 17, 2018	PAPER	BOARD
Decision - Institution of Inter Partes Review	Feb 6, 2018	PAPER	BOARD
Petitioner's Updated Exhibit List	Jan 9, 2018	PAPER	PETITIONER
December 19, 2017 Conference Call Transcript	Jan 9, 2018	EXHIBIT	PETITIONER
Infringement contentions dated February 1 2017	Jan 9, 2018	EXHIBIT	PETITIONER
Denying Petitioner's Request to File Reply to Preliminary Response	Dec 29, 2017	PAPER	BOARD
Patent Owner's Corrected Certificate of Word Count Under 37 C.F.R. 42.24(d)	Nov 8, 2017	PAPER	PATENT OWNER
Patent Owner's Preliminary Response	Nov 7, 2017	PAPER	PATENT OWNER
Patent Owner's Mandatory Notices	Aug 11, 2017	PAPER	PATENT OWNER
Power of Attorney	Aug 11, 2017	PAPER	PATENT OWNER
Notice of Accord Filing Date	Aug 8, 2017	PAPER	BOARD
Applicants Amendment and Response dated August 6, 2010	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent Publication No. 2002/0000611 to Hokazono et al. (Hokazono)	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,228,777 (Arafa)	Jul 26, 2017	EXHIBIT	PETITIONER
Fumio Shimura, Semiconductor Silicon Crystal Technology, at 104-112 (1989) (Shimura Textbook)	Jul 26, 2017	EXHIBIT	PETITIONER
W.O. Publication No. 2002/043151 with certified English translation (Shimizu)	Jul 26, 2017	EXHIBIT	PETITIONER
M. Green et al., Ultrathin (<4 nm) SiO2 and Si-O-N gate dielectric layers for silicon microelectronics: Understanding the processing, structure, and physical and electrical limits, J. Appl. Phys., Vol. 90, No. 5, at 2057-2121 (Sep. 1, 2001)	Jul 26, 2017	EXHIBIT	PETITIONER
H. Wong, Beyond the conventional transistor, IBM Journal of Research and Development, Vol. 46, No. 2/3, at 133-168 (March/May 2002)	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 5,726,479	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,512,266	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 7,893,501	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent Publication No. 2002/0145156 to Igarashi et al. (Igarashi)	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 5,960,270 to Misra et al. (Misra)	Jul 26, 2017	EXHIBIT	PETITIONER
J. Plummer et al., Silicon VLSI Technology: Fundamentals, Practice and Modeling, (1st ed. 2000)	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,406,963 to Woerlee et al. (Woerlee)	Jul 26, 2017	EXHIBIT	PETITIONER
J. Rabaey et al., Digital Integrated Circuits, at 40-44 (2d ed. 2003)	Jul 26, 2017	EXHIBIT	PETITIONER
S. Kang and Y. Leblebici, CMOS Digital Integrated Circuits: Analysis and Design, (2d. ed. 2003)	Jul 26, 2017	EXHIBIT	PETITIONER
K. Maex, Simply irresistible silicides, Physics World, at 35-39 (Nov. 1995)	Jul 26, 2017	EXHIBIT	PETITIONER
Notice of Allowance dated October 15, 2010	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,444,566 to Tsai et al. (Tsai)	Jul 26, 2017	EXHIBIT	PETITIONER
J. Moon et al., A New LDD Structure: Total Overlap with Polysilicon Spacer (TOPS), IEEE Electron Device Letters, Vol. 11, No. 5, at 221-223 (May 1990)	Jul 26, 2017	EXHIBIT	PETITIONER
D. Baglee et al., Reduced Hot-Electron Effects in MOSFETs with an Optimized LDD Structure, IEEE Electron Device Letters, Vol. EDL-5, No. 10, at 389-391 (Oct. 1984)	Jul 26, 2017	EXHIBIT	PETITIONER
E. Gusev et al., Growth and characterization of ultrathin nitride silicon oxide films, IBM J. Res. And Dev., Vol. 43, No. 3, at 265-286 (May 3, 1999)	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,509,234	Jul 26, 2017	EXHIBIT	PETITIONER
Mizuno, T. et al., Hot-Carrier Injection Suppression Due to the Nitride-Oxide LDD Spacer Structure, IEEE Trans. Electron Dev., Vol. 38, No. 3, March, 1991 (Mizuno)	Jul 26, 2017	EXHIBIT	PETITIONER
High k dielectrics - Current status and Materials Properties Considerations, Wilk, G.D., et al., J. App. Phy. Vol. 89, No. 10, May 15, 2001	Jul 26, 2017	EXHIBIT	PETITIONER
U.S. Patent No. 6,806,584	Jul 26, 2017	EXHIBIT	PETITIONER
Togo, M. et al. Low Leakage and High Reliability 1.5 nm SiON Gate-Dielectric Using Radical Oxynitridation for Sub-0.1 um CMOS, 2000 Symposium on VLSI Technology Digest of Technical Papers (2000) (Togo)	Jul 26, 2017	EXHIBIT	PETITIONER
Power of Attorney	Jul 26, 2017	PAPER	PETITIONER
Petition for Inter Partes Review	Jul 26, 2017	PAPER	PETITIONER
Declaration of Stanley R. Shanfield, Ph.D. Regarding U.S. Patent No. 7,893,501, Claims 5, 6, 12, 13, 15, 19, and 21 (Shanfield Decl.)	Jul 26, 2017	EXHIBIT	PETITIONER