The detailed information for PTAB case with proceeding number IPR2019-00023 filed by Samsung Electronics Co., Ltd. et al. against Invensas Bonding Technologies, Inc. et al. on Oct 2, 2018. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number
IPR2019-00023
Filing Date
Oct 2, 2018
Petitioner
Samsung Electronics Co., Ltd. et al.
Respondent
Invensas Bonding Technologies, Inc. et al.
Status
Terminated-Settled
Respondent Application Number
12954740
Respondent Tech Center
2800
Respondent Patent Number
8153505
Termination Date
Dec 21, 2018

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.


Document NameFiling DateCategoryFiling Party

Alert me when new update on this case

Notice of Refund

Feb 1, 2019PAPERBOARD

Petitioner's Request for Refund of Fees

Jan 8, 2019PAPERPETITIONER

Termination Decision Document

Dec 21, 2018PAPERBOARD

Joint Motion to Terminate Proceeding Pursuant to 35 U.S.C. 317 and 37 C.F.R. 42.74

Dec 13, 2018PAPERPETITIONER

Joint Request to File Settlement Agreement and Consent Letter As Business Confidential Information Under 35 U.S.C. 317 and 37 C.F.R. 42.74

Dec 13, 2018PAPERPETITIONER

Ex. 1026

Dec 13, 2018EXHIBITPETITIONER

Ex. 1027

Dec 13, 2018EXHIBITPETITIONER

Notice of Accord Filing Date

Nov 30, 2018PAPERBOARD

Patent Owner's Motion for District Court (Phillips) Patent Claim Construction

Oct 31, 2018PAPERPATENT OWNER

Patent Owner's Power of Attorney

Oct 22, 2018PAPERPATENT OWNER

Patent Owner's Mandatory Notices

Oct 22, 2018PAPERPATENT OWNER

Power of Attorney Samsung Electronics Co., Ltd.

Oct 2, 2018PAPERPETITIONER

U.S. Patent No. 8,153,505 ("the "505 Patent")

Oct 2, 2018EXHIBITPETITIONER

Curriculum Vitae for Dr. Charles Hunt

Oct 2, 2018EXHIBITPETITIONER

C. Harendt, Vertical Polysilicon Interconnects by Aligned Wafer Bonding, 97-36 Electrochemical Society Proceedings 501 (1998) ("Harendt")

Oct 2, 2018EXHIBITPETITIONER

M. Reiche, The Effect of a Plasma Pretreatment on the Si/Si Bonding Behaviour, 97-36 Electrochemical Society Proceedings 437 (1998) ("Reiche")

Oct 2, 2018EXHIBITPETITIONER

Q. Tong et al., Semiconductor Wafer Bonding: Recent Developments, 37 Materials Chemistry and Physics 101 (1994) ("Tong')

Oct 2, 2018EXHIBITPETITIONER

Johann Steinkirchner et al., Silicon Wafer Bonding via Designed Monolayers, 7 Advanced Materials 7, 662 (1995)

Oct 2, 2018EXHIBITPETITIONER

John L. Vossen et al., Thin Film Processes, Academic Press (1978) (excerpts)

Oct 2, 2018EXHIBITPETITIONER

John L. Vossen et al., Thin Film Processes II, Academic Press (1991) (excerpts)

Oct 2, 2018EXHIBITPETITIONER

Yang Li, Systematic Low Temperature Bonding and Its Application To The Hydrogen Ion Cut Process And Three- Dimensional Structures, University of California, Davis (1999)

Oct 2, 2018EXHIBITPETITIONER

Watters Declaration regarding Li (Ex-1006)

Oct 2, 2018EXHIBITPETITIONER

Declaration of Electrochemical Society regarding Reiche (Ex- 1007)

Oct 2, 2018EXHIBITPETITIONER

PETITION FOR INTER PARTES REVIEW OF U.S. PATENT NO. 8,153,505

Oct 2, 2018PAPERPETITIONER

Power of Attorney Samsung Electronics America, Inc.

Oct 2, 2018PAPERPETITIONER

Prosecution File History of U.S. Patent No. 8,153,505

Oct 2, 2018EXHIBITPETITIONER

Declaration of Dr. Charles Hunt

Oct 2, 2018EXHIBITPETITIONER

Y. Li et al., Systematic Low Temperature Silicon Bonding Using Pressure and Temperature, 1998 Jpn. J. Appl. Phys. 37 (1998) ("Li")

Oct 2, 2018EXHIBITPETITIONER

Q. Tong et al., Semiconductor Wafer Bonding: Science and Technology, John Wiley & Sons, Inc. (1999)

Oct 2, 2018EXHIBITPETITIONER

Ricardo D'Agostino, Plasma Etching of Si and SiO2 in SF6- O2 mixtures, 52(1) J. Appl. Phys. 162 (1981)

Oct 2, 2018EXHIBITPETITIONER

Elsevier Declaration Regarding Tong (Ex-1009) (Part 1 of 2)

Oct 2, 2018EXHIBITPETITIONER

Elsevier Declaration Regarding Tong (Ex-1009) (Part 2 of 2)

Oct 2, 2018EXHIBITPETITIONER

Hall-Ellis Declaration Regarding Harendt (Ex-1005)

Oct 2, 2018EXHIBITPETITIONER

U.S. Patent No. 5,503,704, Nitrogen Based Low Temperature Direct Bonding (1996) ("Bower")

Oct 2, 2018EXHIBITPETITIONER

Qin-Yi Tong, Wafer Bonding and Layer Splitting for Microsystems, 11 Adv. Mater. 17 (1999)

Oct 2, 2018EXHIBITPETITIONER

Robert W. Bower, Low temperature Si3N4 direct bonding, 62 Appl. Phys. Lett. 26 (1993)

Oct 2, 2018EXHIBITPETITIONER