The detailed information for PTAB case with proceeding number IPR2020-01261 filed by Texas Instruments Incorporated against Vantage Micro, LLC et al. on Jul 20, 2020. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number
IPR2020-01261
Filing Date
Jul 20, 2020
Petitioner
Texas Instruments Incorporated
Respondent
Vantage Micro, LLC et al.
Status
Terminated-Settled
Respondent Application Number
09430476
Respondent Tech Center
2100
Respondent Patent Number
6546508
Termination Date
Nov 24, 2020

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.


Document NameFiling DateCategoryFiling Party

Alert me when new update on this case

Notice of Refund

Dec 15, 2020PAPERBOARD

Petitioner's Requests for Refund of Post-Institution Fees

Dec 4, 2020PAPERPETITIONER

TERMINATION Settlement Prior to Institution of Trial

Nov 24, 2020PAPERBOARD

Joint Motion To Terminate

Nov 18, 2020PAPERPETITIONER

Joint Requests to Keep Agreement Business Confidential and Separate

Nov 18, 2020PAPERPETITIONER

Settlement Agreement

Nov 18, 2020EXHIBITPETITIONER

Notice of Accord Filing Date

Aug 25, 2020PAPERBOARD

Patent Owner's Mandatory Notices

Aug 10, 2020PAPERPATENT OWNER

Patent Owner's Power of Attorney

Aug 10, 2020PAPERPATENT OWNER

U.S. Patent No. 6,546,508 to Sonderman et al

Jul 20, 2020EXHIBITPETITIONER

Prosecution History of the 508 Patent

Jul 20, 2020EXHIBITPETITIONER

Mullins Advanced Process Control Framework Initiative (APCFI) 1.0 Specifications

Jul 20, 2020EXHIBITPETITIONER

U.S. Patent No. 5,526,293 Mozumder

Jul 20, 2020EXHIBITPETITIONER

U.S. Patent No. 6,556,881 Miller

Jul 20, 2020EXHIBITPETITIONER

Budge, PARSEC Process Analysis With Recipe Support for Etcher Control

Jul 20, 2020EXHIBITPETITIONER

Declaration of C. Alan Weber

Jul 20, 2020EXHIBITPETITIONER

Slides from Real-time Data Acquisition and Fault Detection System presentation at SEMATECH AEC/APC Workshop VIII (October 28, 1996)

Jul 20, 2020EXHIBITPETITIONER

Mozumder Statistical Feedback Control of a Plasma Etch Process

Jul 20, 2020EXHIBITPETITIONER

Musat Evaluation of Brookside Fault Detection and Classification (FC) Software on Applied Materials 5000 and 5300 Etch Tools

Jul 20, 2020EXHIBITPETITIONER

Bennet Advanced Process Control Framework Initiative (APCFI) Proposal Summary and Plan

Jul 20, 2020EXHIBITPETITIONER

U.S. Patent No. 6,363,294 to Coronel et al

Jul 20, 2020EXHIBITPETITIONER

U.S. Patent No. 4,847,792 to Barna et al

Jul 20, 2020EXHIBITPETITIONER

Barna APC in the Semiconductor Industry, History and Near Term Prognosis

Jul 20, 2020EXHIBITPETITIONER

Appendix A3 of Vantage Micros Preliminary Infringement Contentions from Vantage Micro LLC v. Texas Instruments Inc

Jul 20, 2020EXHIBITPETITIONER

Edgar, Automatic control in microelectronics manufacturing Practices, challenges, and possibilities

Jul 20, 2020EXHIBITPETITIONER

McGehee The MMST Computer-Integrated Manufacturing System Framework

Jul 20, 2020EXHIBITPETITIONER

Declaration of Thomas F Edgar

Jul 20, 2020EXHIBITPETITIONER

Declaration of Stephanie Butler

Jul 20, 2020EXHIBITPETITIONER

Declaration of Jacob R. Munford

Jul 20, 2020EXHIBITPETITIONER

Vantage Micro LLC's Opposition to Texas Instruments Incorporated's Motion for Judgment on the Pleadings That It Does Not Infringe U.S. Patent No. 6,546,508

Jul 20, 2020EXHIBITPETITIONER

Petitioner's Power of Attorney

Jul 20, 2020PAPERPETITIONER

Petition for Inter Partes Review

Jul 20, 2020PAPERPETITIONER