The detailed information for PTAB case with proceeding number IPR2023-00653 filed by Samsung Electronics Co., Ltd. et al. against Daedalus Prime LLC on Mar 6, 2023. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number
IPR2023-00653
Filing Date
Mar 6, 2023
Petitioner
Samsung Electronics Co., Ltd. et al.
Respondent
Daedalus Prime LLC
Status
Terminated-Settled
Respondent Application Number
16881541
Respondent Tech Center
2800
Respondent Patent Number
11251281
Termination Date
Jun 28, 2023

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.


Document NameFiling DateCategoryFiling Party

Alert me when new update on this case

Notice: refund approved

Jul 14, 2023PAPERBOARD

Petitioner's Request for Refund

Jul 11, 2023PAPERPETITIONER

Termination Decision: Settlement Prior to Institution of Trial 37 C.F.R. sec. 42.74

Jun 28, 2023PAPERBOARD

Joint Motion to Terminate

Jun 13, 2023PAPERPETITIONER

Joint Request to Keep Settlement Agreement Confidential

Jun 13, 2023PAPERPETITIONER

Settlement Agreement

Jun 13, 2023EXHIBITPETITIONER

Exhibit 3001

May 3, 2023EXHIBITBOARD

Order: Conduct of the Proceeding

May 3, 2023PAPERBOARD

Notice: Notice filing date accorded

Apr 17, 2023PAPERBOARD

Notice : Power of Attorney

Mar 27, 2023PAPERPATENT OWNER

Notice : Mandatory Notice

Mar 27, 2023PAPERPATENT OWNER

Petitioner's Power of Attorney

Mar 6, 2023PAPERPETITIONER

U.S. Patent No. 11,251,281 to Glass

Mar 6, 2023EXHIBITPETITIONER

Certified English Translation of Japanese Publication No 2010-171337 Tezuka

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20100276761 Tung

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20110073952 Kwok

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20100148217 Simonelli

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20120139015 Yu

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20090325607 Conway

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20110042748 Anderson

Mar 6, 2023EXHIBITPETITIONER

Japanese Patent Application Publication No. 2010-171337

Mar 6, 2023EXHIBITPETITIONER

Excerpts of the File History of EP Patent App. No. 19188924.5

Mar 6, 2023EXHIBITPETITIONER

Exhibit 47 to Complaint

Mar 6, 2023EXHIBITPETITIONER

Exhibit 48 to Complaint

Mar 6, 2023EXHIBITPETITIONER

Shearer, Power Management in Mobile Devices

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20110147842 Cappellani

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent No. 7,288,443 Zhu

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent No. 20070235802 Chong

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20050184316 Kim

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20070082451 Samoilov

Mar 6, 2023EXHIBITPETITIONER

Nishida Elimination of Misfit Dislocations in Si1-xGex/Si Heterostructures

Mar 6, 2023EXHIBITPETITIONER

Fitzgerald,The Effect of Substrate Growth Area on Misfit and Threading

Mar 6, 2023EXHIBITPETITIONER

Larsen Epitaxial Growth of Ge and SiGe on Si Substrates

Mar 6, 2023EXHIBITPETITIONER

Schubert Room Temperature Properties of Si, Ge, GaAs, and GaN

Mar 6, 2023EXHIBITPETITIONER

Elsevier, Encyclopedia of Materials

Mar 6, 2023EXHIBITPETITIONER

Kim Increased Critical Thickness for High Ge-Content Strained SiGe-on-Si

Mar 6, 2023EXHIBITPETITIONER

Semiconductor Doping Technology

Mar 6, 2023EXHIBITPETITIONER

Stavitski, Silicide toSilicon Specific Contact Resistance Characterization

Mar 6, 2023EXHIBITPETITIONER

EP Application No. 1 575 082 A2 Demeurisse

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent No. 5,296,386 Aronowitz

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20060286755 Brask

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20110024804 Chang

Mar 6, 2023EXHIBITPETITIONER

Hadley, Semiconductor Doping, Institute of Solid State Physics

Mar 6, 2023EXHIBITPETITIONER

Mirabella Mechanisms of Boron Diffusion in Silicon and Germanium

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20060071275 Brask

Mar 6, 2023EXHIBITPETITIONER

Brown Lattice stability and point defect energetics of TiSi2 and TiGe2

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20090325350 Radosavljevic

Mar 6, 2023EXHIBITPETITIONER

Caputa, Efficient High Speed On-Chip Global Interconnects

Mar 6, 2023EXHIBITPETITIONER

Zhao, All About Interconnects

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 5,439,848 Hsu

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent App. Pub. No. 20100123198 Kim

Mar 6, 2023EXHIBITPETITIONER

U.S. Patent No. 7,692,254 Anderson

Mar 6, 2023EXHIBITPETITIONER

U.S. Application Serial No. 12975278

Mar 6, 2023EXHIBITPETITIONER

Daedalus Prime LLCs Complaint In the Matter of Certain Semiconductor Device

Mar 6, 2023EXHIBITPETITIONER

Complaint, Daedalus Prime LLC v. Samsung Electronics Co. Ltd. et al

Mar 6, 2023EXHIBITPETITIONER

Order Granting Stay

Mar 6, 2023EXHIBITPETITIONER

Director Vidals Memorandum re Interim Procedure for Discretionary Denials

Mar 6, 2023EXHIBITPETITIONER

Excerpts of the File History of the 281 Patent

Mar 6, 2023EXHIBITPETITIONER

U.S. Application Serial No. 13990224

Mar 6, 2023EXHIBITPETITIONER

Declaration of E. Fred Schubert

Mar 6, 2023EXHIBITPETITIONER

Petition for Inter Partes Review

Mar 6, 2023PAPERPETITIONER