Solus Advanced Materials Co., Ltd. et al. vs SK nexilis Co., Ltd.

Petitioners Request for Rehearing

Institution Decision: DECISION Denying Institution of Inter Partes Review 35 U.S.C. § 314

Petitioner's Reply to Supplemental Brief

Patent Owner's Supplemental Brief

Patent Owner Updated Mandatory Notices

Patent Owner's Sur-Reply in Support of Patent Owner's Preliminary Response

Petitioners Reply to Patent Owners Preliminary Response

Board Email of February 24, 2025 authorizing Petitioner’s Reply

Federal Court Management Statistics

Amended Complaint_2:23-cv-00539

Stipulation Letter

Patent Owner Preliminary Response

EX2001 - Defendants’ Motion to Stay

EX2002 - Plaintiff’s Opposition to Defendants’ Motion to Stay

EX2003 - Defendants’ Reply in Support of Motion to Stay

EX2004 - Plaintiff’s Sur-Reply in Opposition to Defendants’ Motion to Stay

EX2005 - Amended Docket Control Order - EDTX-2-23-cv-00539-1

EX2007 - Complaint - EDTX-2-23-cv-00539-1

EX2008 - Docket Navigator - Gilstrap Transfer Stats

EX2009 - Order Granting Service Waiver

EX2010 - Solus Invalidity Contentions and Appendices

EX2011 - Appendix B – Secondary Reference Chart

EX2012 - Espacenet – Dobashi

EX2013 - Espacenet – Shinozaki

EX2014 - Espacenet – Toshio

EX2015 - Continuity - Application - Patent Center - Kim

EX2016 - Espacenet – Sano

EX2017 - Average Roughness basics - Michigan Metrology

EX2006 - United States District Courts — National Judicial Caseload Profile

Patent Owner's Updated Mandatory Notices

Patent Owner's Updated Power of Attorney

Notice : Mandatory Notice

Notice : Power of Attorney

Notice: Notice filing date accorded

U.S. Patent No. 10,480,090

Excerpts from Prosecution History of the ’090 Patent

U.S. Patent Pub. No. 2013/0108922 Shinozaki

Fabian et al., Assessment of activated polyacrylamide and guar as organic

U.S. Patent Pub. No. 2009/0047539 Dobashi

U.S. Patent Pub. No. 2006/0191798 Sano

U.S. Patent Pub. No. 5834140 Wolski

PCT Patent Pub. No. KR2014/012942 Choi

Certified English Translation of KR2014/012942 and Translators Declaration

U.S. Patent Pub. No. 2013/0108887 Kim

Korean Patent Pub. No. 2012/0003485A Toshio

Certified English Translation of KR 2012/0003485A and Translators Dec

Griesi, Characterization of Electrodeposited Copper Foil Surface Roughness

Gadelmawla, Roughness parameters

Surface roughness – Definitions and designation B 0601-1994

Surface roughness – Definitions and designation B 0601-2001

Geometrical Product Specifications (GPS) – Surface texture

Operating Instructions MarSurf M 300 + RD 18

Surface Texture Surface Roughness, Waviness, And Lay

Japanese Patent Pub. No. JP 2007/217787 Matsuda

Surface Roughness Measurement-Parameters

Bhushan, Surface roughness analysis and measurement techniques

U.S. Patent Pub. No. 2014/0302281 Yacovone

Certified English Translation of JP 2007/217787 and Translators Dec

Griesi, Electrodeposited Copper Foil Surface Characterization for Accurate

U.S. Patent Pub. No. US20140342178A1 Saito

U.S. Patent Pub. No. US20100038115A1 Matsuda 115

Lowenheim, Modern Electroplating

Measurement of roughness average Ra and peak count RPc on metallic flat

September 11, 2024 Email from SK nexilis Counsel

Motion to Transfer Venue

Munford Declaration

Power of Attorney

Japanese Patent Pub. No. JP 2010/103061A Kodaira

Japanese Patent Pub. No. JP 2014/065933A Yoshiki

Proposed Scheduling Order

Korean Patent Pub. No. KR 2014/0078883A Lee

Declaration of Michael Randall

Petition for Inter Partes Review