The detailed information for PTAB case with proceeding number IPR2025-00889 filed by GLOBALFOUNDRIES Inc. et al. against OAK IP LLC on May 13, 2025. This includes filing dates, application numbers, tech centers, patent numbers, and current case status.

Case Details

Proceeding Number
IPR2025-00889
Filing Date
May 13, 2025
Petitioner
GLOBALFOUNDRIES Inc. et al.
Respondent
OAK IP LLC
Status
Pending
Respondent Application Number
15877837
Respondent Tech Center
2800
Respondent Patent Number
10090395

Proceeding Documents

The table below shows documents filed in the case, listing each document name, filing date, document type, and filing party. Tracking these filings indicates the activity of the parties involved in the case, and the types of documents filed can provide insights into the legal strategies being employed.


Document NameFiling DateCategoryFiling Party

Alert me when new update on this case

Notice: Notice filing date accorded

Jun 13, 2025PAPERBOARD

Notice: PO Mandatory Notice

May 20, 2025PAPERPATENT OWNER

Ex. 1001 U.S. Patent No. 10,090,395

May 13, 2025EXHIBITPETITIONER

Ex. 1002 File History of U.S. Patent No. 7,084,423

May 13, 2025EXHIBITPETITIONER

Ex. 1003 U.S. Patent No. 7,084,423

May 13, 2025EXHIBITPETITIONER

Ex. 1004 File History of U.S. Patent No. 6,833,556

May 13, 2025EXHIBITPETITIONER

Ex. 1005 U.S. Patent No. 6,833,556

May 13, 2025EXHIBITPETITIONER

Ex. 1006 File History of U.S. Patent No. 7,462,860

May 13, 2025EXHIBITPETITIONER

Ex. 1007 U.S. Patent No. 7,462,860

May 13, 2025EXHIBITPETITIONER

Ex. 1008 File History of U.S. Patent No. 7,884,003

May 13, 2025EXHIBITPETITIONER

Ex. 1009 U.S. Patent No. 7,884,003

May 13, 2025EXHIBITPETITIONER

Ex. 1010 File History of U.S. Patent No. 8,431,469

May 13, 2025EXHIBITPETITIONER

Ex. 1011 U.S. Patent No. 8,431,469

May 13, 2025EXHIBITPETITIONER

Ex. 1012 File History of U.S. Patent No. 9,425,277

May 13, 2025EXHIBITPETITIONER

Ex. 1013 U.S. Patent No. 9,425,277

May 13, 2025EXHIBITPETITIONER

Ex. 1014 File History of U.S. Patent No. 9,905,691

May 13, 2025EXHIBITPETITIONER

Ex. 1015 U.S. Patent No. 9,905,691

May 13, 2025EXHIBITPETITIONER

Ex. 1016 File History of U.S. Patent No. 9,812,542

May 13, 2025EXHIBITPETITIONER

Ex. 1017 U.S. Patent No. 9,812,542

May 13, 2025EXHIBITPETITIONER

Ex. 1018 File History of U.S. Patent No. 10,388,748

May 13, 2025EXHIBITPETITIONER

Ex. 1019 U.S. Patent No. 10,388,748

May 13, 2025EXHIBITPETITIONER

Ex. 1020 File History of U.S. Patent No. 10,090,395

May 13, 2025EXHIBITPETITIONER

Ex. 1021 U.S. Patent No. 7,176,483 (Grupp)

May 13, 2025EXHIBITPETITIONER

Ex. 1023 Rhoderick, Metal-semiconductor contacts

May 13, 2025EXHIBITPETITIONER

Ex. 1024 Chang et al., Specific contact resistance

May 13, 2025EXHIBITPETITIONER

Ex. 1025 Goodnick et al., Effects of a thin SiO2 layer

May 13, 2025EXHIBITPETITIONER

Ex. 1026 Sobolewski & Helms, Studies of barrier height

May 13, 2025EXHIBITPETITIONER

Ex. 1027 U.S. Patent No. 4,110,488 (Risko)

May 13, 2025EXHIBITPETITIONER

Ex. 1028 Taubenblatt et al., Interface effects in titanium and hafnium (19

May 13, 2025EXHIBITPETITIONER

Ex. 1029 U.S. Patent No. 3,983,264 (Schroen)

May 13, 2025EXHIBITPETITIONER

Ex. 1030 U.S. Patent No. 4,845,050 (Kim)

May 13, 2025EXHIBITPETITIONER

Ex. 1031 JPH11162874A

May 13, 2025EXHIBITPETITIONER

Ex. 1032 Certified Translation JPH11162874A (Iwaguro)

May 13, 2025EXHIBITPETITIONER

Ex. 1033 Brassard et al., Tuning the electrical resistivity (2004)

May 13, 2025EXHIBITPETITIONER

Ex. 1034 Redline of Specification 483 Patent & 423 Patent

May 13, 2025EXHIBITPETITIONER

Ex. 1035 Brassard & Khakani, Pulsed-laser deposition of high (2005)

May 13, 2025EXHIBITPETITIONER

Ex. 1036 Brassard et al., Substrate biasing effect on the electrical (2007)

May 13, 2025EXHIBITPETITIONER

Ex. 1037 U.S. Pub. No. 2014-0117465 (Huang)

May 13, 2025EXHIBITPETITIONER

Ex. 1038 Complaint, E.D.Tex. 19cv00347

May 13, 2025EXHIBITPETITIONER

Ex. 1042 Ex. F to Acorn’s Preliminary Infringement Contentions (395 patent)

May 13, 2025EXHIBITPETITIONER

Ex. 1043 Redaction to 394 Response to JMOL on Noninfringement

May 13, 2025EXHIBITPETITIONER

Ex. 1044 Ex. B-1 Piner Trial Demonstratives, Redacted

May 13, 2025EXHIBITPETITIONER

Ex. 1045 Jury Verdict form, 19cv347

May 13, 2025EXHIBITPETITIONER

Ex. 1046 Mott & Friedman, Metal-insulator transitions

May 13, 2025EXHIBITPETITIONER

Ex. 1047 Asbrink & Magnéli, Crystal structure studies on trititanium (1959)

May 13, 2025EXHIBITPETITIONER

Ex. 1048 Dr. Kuhn’s Deposition Transcript from July 6, 2021 with errata

May 13, 2025EXHIBITPETITIONER

Ex. 1049 Dr. Kuhn’s Deposition Transcript from July 7, 2021 with errata

May 13, 2025EXHIBITPETITIONER

Ex. 1050 Kostenko et al., Simulation of the short-range order

May 13, 2025EXHIBITPETITIONER

Ex. 1051 Valeeva & Kostenko, Stable Ti9O10 nanophase grown

May 13, 2025EXHIBITPETITIONER

Ex. 1052 Gerlich et al., Thermoelastic properties of ULE

May 13, 2025EXHIBITPETITIONER

Ex. 1053 Robb, “Plasma etching of oxygen containing (1984)

May 13, 2025EXHIBITPETITIONER

Ex. 1054 Stella et al., Charge Transport Through Thin

May 13, 2025EXHIBITPETITIONER

Ex. 1055 Lee et al., Tunnel barrier engineering of titanium

May 13, 2025EXHIBITPETITIONER

Ex. 1056 Murray et al., The O-Ti (Oxygen-Titanium) system

May 13, 2025EXHIBITPETITIONER

Ex. 1057 Al-Ani et al., The optical absorption edge of amorphous

May 13, 2025EXHIBITPETITIONER

Ex. 1058 Tian et al., Effect of Microstructure of TiO2 Thing Films

May 13, 2025EXHIBITPETITIONER

Ex. 1059 Wang et al., High-Performance Photothermal Conversion

May 13, 2025EXHIBITPETITIONER

Ex. 1060 Roy & Krupanidhi, Pulsed excimer laser ablated barium

May 13, 2025EXHIBITPETITIONER

Ex. 1061 Hao et al., Dielectric properties of pulsed-laser-deposited

May 13, 2025EXHIBITPETITIONER

Ex. 1062 Shveikin, Magnetic Properties of Ti3O6 with Chromium

May 13, 2025EXHIBITPETITIONER

Ex. 1063 Denker, Electronic Properties of Titanium Monoxide

May 13, 2025EXHIBITPETITIONER

Ex. 1064 van de Krol et al., Electrical and optical properties

May 13, 2025EXHIBITPETITIONER

Ex. 1065 Imai et al., Interfacial reaction of MgO-TiOx superlattice

May 13, 2025EXHIBITPETITIONER

Ex. 1066 CC Vacuum Coating Materials Co, Ltd. (July 21, 2021)

May 13, 2025EXHIBITPETITIONER

Ex. 1067 Pontes et al., High dielectric constant of SrTiO3

May 13, 2025EXHIBITPETITIONER

Ex. 1068 Doeff et al., Titanate anodes for sodium ion batteries

May 13, 2025EXHIBITPETITIONER

Ex. 1069 Mo & Ching, Electronic and optical properties of three

May 13, 2025EXHIBITPETITIONER

Ex. 1070 Nguyen et al., Optical Properties of Jet‐Vapor‐Deposited

May 13, 2025EXHIBITPETITIONER

Ex. 1071 Rangel-Kuoppa & Conde-Gallardo, Ohmic contact recipe

May 13, 2025EXHIBITPETITIONER

Ex. 1072 Glebov et al., Planar optical waveguides on glasses

May 13, 2025EXHIBITPETITIONER

Ex. 1073 Shikama et al., Erosion behaviour of physically vapour-deposited

May 13, 2025EXHIBITPETITIONER

Ex. 1074 Szydlo & Poirier, I-V and C-V Characteristics of AuTi02

May 13, 2025EXHIBITPETITIONER

Ex. 1075 CPHMI Phelly Materials, Phelly Ti3O5

May 13, 2025EXHIBITPETITIONER

Ex. 1076 Hong, Crystal Growth of Some Intermediate (1982)

May 13, 2025EXHIBITPETITIONER

Ex. 1077 Gwo et al., Local electric-field-induced oxidation

May 13, 2025EXHIBITPETITIONER

Ex. 1078 Takeuchi et al., Dielectric properties of sputtered

May 13, 2025EXHIBITPETITIONER

Ex. 1079 Fitzgibbons et al., TiO2 Film Properties as a Function

May 13, 2025EXHIBITPETITIONER

Ex. 1080 Bertaud et al., Ultra wide band frequency characterization

May 13, 2025EXHIBITPETITIONER

Ex. 1081 Liu et al., Structural, electronic, mechanical

May 13, 2025EXHIBITPETITIONER

Ex. 1082 Hallock et al., Method to Fabricate Low Stress

May 13, 2025EXHIBITPETITIONER

Ex. 1083 US4912286 (Clarke)

May 13, 2025EXHIBITPETITIONER

Ex. 1084 Yang et al., A novel carbon thermal reduction

May 13, 2025EXHIBITPETITIONER

Ex. 1085 Kashiwaya et al., The Work Function of TiO2 (2018)

May 13, 2025EXHIBITPETITIONER

Ex. 1086 Bartkowski et al., Electronic structure of titanium (1997)

May 13, 2025EXHIBITPETITIONER

Ex. 1087 Marques & Jasieniak, Ionization potential and electron

May 13, 2025EXHIBITPETITIONER

Ex. 1088 Chen, et al., Ground state structure (2020)

May 13, 2025EXHIBITPETITIONER

Ex. 1089 Petition, IPR2020-01207

May 13, 2025EXHIBITPETITIONER

Ex. 1090 Institution Decision, IPR2020-01207

May 13, 2025EXHIBITPETITIONER

Ex. 1091 Final Written Decision, IPR2020-01207

May 13, 2025EXHIBITPETITIONER

Ex. 1092 Trial Transcript, Redacted, Acorn v. Samsung Vol 2

May 13, 2025EXHIBITPETITIONER

Ex. 1093 Final Judgment, 2021.07.13 ECF 379

May 13, 2025EXHIBITPETITIONER

Ex. 1095 Complaint, 25-cv-00142

May 13, 2025EXHIBITPETITIONER

Ex. 1096 Petition, IPR2020-01282

May 13, 2025EXHIBITPETITIONER

Ex. 1097 Final Written Decision, IPR2020-01282

May 13, 2025EXHIBITPETITIONER

Ex. 1098 Institution Decision, IPR2020-01282

May 13, 2025EXHIBITPETITIONER

Ex. 1099 U.S. Patent No. 5,216,282 (Cote)

May 13, 2025EXHIBITPETITIONER

Ex. 1100 Markman Order, E.D. Tex. 19-cv-00347

May 13, 2025EXHIBITPETITIONER

Ex. 1101 U.S. Patent No. 6,724,088 (Jammy)

May 13, 2025EXHIBITPETITIONER

Ex. 1102 Brassard et al., Compositional effect on the dielectric (2006)

May 13, 2025EXHIBITPETITIONER

Ex. 1103 Stesmans et al., Si dangling-bond-type defects

May 13, 2025EXHIBITPETITIONER

Ex. 1104 EDTX-2-19-cv-00347-416

May 13, 2025EXHIBITPETITIONER

Ex. 1105 Certificate of Cancellation for 395 patent

May 13, 2025EXHIBITPETITIONER

Ex. 1106 Acorn Semi Statutory Disclaimer

May 13, 2025EXHIBITPETITIONER

Ex. 1107 S. M. Sze Semiconductor Devices

May 13, 2025EXHIBITPETITIONER

Ex. 1108 Lucovsky et al, Bonding Constraint-Induced Defect (1999)

May 13, 2025EXHIBITPETITIONER

Ex. 1109 GlobalFoundries waived service (3-4-2025)

May 13, 2025EXHIBITPETITIONER

Ex. 1110 Groner et al, Electrical Characterization of Thin (2002)

May 13, 2025EXHIBITPETITIONER

Ex. 1111 Tsai et al, Surface Preparation and Interfacial Stability (2002)

May 13, 2025EXHIBITPETITIONER

Ex. 1112 Raider et al, Oxide Growth on Etched Silicon (1975)

May 13, 2025EXHIBITPETITIONER

Ex. 1113 Cerofolini et al, Mechanisms and Kinetics (1997)

May 13, 2025EXHIBITPETITIONER

Ex. 1114 Mende et al, Oxidation of Etched Silicon (1983)

May 13, 2025EXHIBITPETITIONER

Ex. 1094 Luo, High-k Gate Dielectrics for Si CMOS

May 13, 2025EXHIBITPETITIONER

Ex. 1115 Toshiba, Basics of Schottky Barrier, Ch.1 (2022)

May 13, 2025EXHIBITPETITIONER

Ex. 1116 Final Written Decision, IPR2020-01183 (2-9-2022)

May 13, 2025EXHIBITPETITIONER

Ex. 1117 TiO Melting Point

May 13, 2025EXHIBITPETITIONER

Ex. 1118 TiO2 Melting Point

May 13, 2025EXHIBITPETITIONER

Ex. 1119 Ti2O3 Melting Point

May 13, 2025EXHIBITPETITIONER

Ex. 1022 Declaration of E. Fred Schubert

May 13, 2025EXHIBITPETITIONER

Petition: as filed

May 13, 2025PAPERPETITIONER

Petitioner's Power of Attorney

May 13, 2025PAPERPETITIONER