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Analysis Device, Microscope Device, Analysis Method, And Program

Patent No. EP3051276 (titled "Analysis Device, Microscope Device, Analysis Method, And Program") was filed by Nikon on Sep 26, 2014. The application was issued on Mar 31, 2021.

Patent Summary

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Patent Oppositions (2)

Patent oppositions filed by competitors challenge the validity of a granted patent. These oppositions are typically based on claims of prior art, lack of novelty, or non-obviousness. They are a key part of the process for determining a patent's strength and enforceability.

CompanyOpposition DateRepresentative
LEICA MICROSYSTEMS CMSDec 29, 2021BRADL
CARL ZEISSDec 28, 2021SCHIFFER

Dossier Documents

The dossier documents provide a comprehensive record of the patent's prosecution history - including filings, correspondence, and decisions made by patent offices - and are crucial for understanding the patent's legal journey and any challenges it may have faced during examination.

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EP3051276

NIKON
Application Number
EP14850023A
Filing Date
Sep 26, 2014
Status
Granted And Under Opposition
Feb 26, 2021
Publication Date
Mar 31, 2021
External Links
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