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Analysis Device, Microscope Device, Analysis Method, And Program

Patent No. EP3051276 (titled "Analysis Device, Microscope Device, Analysis Method, And Program") was filed by Nikon on Sep 26, 2014. The application was issued on Jan 21, 2026.

Patent Summary

An analysis device for quantitative analysis of high-resolution stochastic optical reconstruction microscopy (STORM) images comprises a picture imaging forming unit and a sample picture image analysis unit. The imaging unit generates a sample picture from multiple fluorescent pictures. The analysis unit includes an area setting unit that defines predetermined areas relative to bright spots within the sample picture and an analysis processing unit that quantifies the states of bright spots within these areas as numerical values. For a plurality of areas, including a first and second area, the device defines corresponding first and second state values. If the first and second areas overlap, the area setting unit assigns the sum of the first and second state values as the numerical value for the overlapping area.

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Patent Oppositions (2)

Patent oppositions filed by competitors challenge the validity of a granted patent. These oppositions are typically based on claims of prior art, lack of novelty, or non-obviousness. They are a key part of the process for determining a patent's strength and enforceability.

CompanyOpposition DateRepresentative
LEICA MICROSYSTEMS CMSDec 29, 2021BRADL
CARL ZEISS MICROSCOPY GMBHDec 28, 2021SCHIFFER

Dossier Documents

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EP3051276

NIKON
Application Number
EP14850023A
Filing Date
Sep 26, 2014
Status
Patent Maintained As Amended
Dec 19, 2025
Publication Date
Jan 21, 2026
External Links
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