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Explore patent oppositions filed by Nikon against competitors, revealing strategic technology disputes and market positioning. Monitor opposition details, timelines, and disputed innovations to understand competitive dynamics and IP enforcement strategy.

Patent NumberTitleApplicantOpposition Date
EP3823814Method And Apparatus For Producing An Object By Means Of Additive ManufacturingADDITIVE INDUSTRIESDec 13, 2023
EP3538293Method For The Additive Manufacture Of Components In Layers, And Corresponding Computer Program ProductTRUMPF LASER UND SYSTEMTECHNIKApr 13, 2023
EP3544787System For Producing An Object By Means Of Additive ManufacturingADDITIVE INDUSTRIESFeb 21, 2023
EP3495077Powder Spreading Quality Test Method And Additive Manufacturing DeviceXIAN BRIGHT LASERFeb 2, 2023
EP3594498Gas Recirculation Device And System With SamePFEIFFER VACUUMOct 5, 2022
EP3470207Plant For Additively Manufacturing Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSAug 5, 2022
EP3466650Device For Additive Production Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSJul 25, 2022
EP3393807Device And Method For Producing A Three-Dimensional ObjectEOS ELECTRO OPTICAL SYSTEMSJul 6, 2022
EP3434443Apparatus For Additively Manufacturing Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSMay 31, 2022
EP3369570Device For Additive Production Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSMay 18, 2022

Explore Nikon's recently opposed patents, revealing key competitive challenges and strategic patent disputes in the industry. Track oppositions filed by competitors to understand technology battlegrounds and assess potential risks.

Patent NumberGrant DateTitleTotal Oppositions
EP3713694Jan 3, 2024Apparatus And Method For Producing A Three-Dimensional Work Piece1
EP3151053Nov 29, 2023Focusing Device, Microscope Device, Focusing Method, And Control Program1
EP2902817Sep 27, 2023Optical Component And Method For Producing Same1
EP2034349Jul 19, 2023Observing Apparatus And Observing Method1
EP3129750May 31, 2023Measurement Probe Unit For Metrology Applications1
EP3051276Mar 31, 2021Analysis Device, Microscope Device, Analysis Method, And Program2
EP1956360Dec 2, 2020Observing Device1
EP2037255Nov 18, 2020Spectrum Observation Method And Spectrum Observation System1
EP2345920Jan 16, 2019Microscope System1
EP2633268Sep 26, 2018Profile Measuring Apparatus, Method For Manufacturing Structure, And Structure Manufacturing System1