Nikon competitive analysis

Explore patent oppositions filed by Nikon against competitors, revealing strategic technology disputes and market positioning.

Last updated on: Jul 9, 2026
Patent NumberTitleApplicantOpposition Date
Method And Apparatus For Producing An Object By Means Of Additive ManufacturingADDITIVE INDUSTRIESDec 13, 2023
Method For The Additive Manufacture Of Components In Layers, And Corresponding Computer Program ProductADDITIVE MANUFACTURINGApr 13, 2023
System For Producing An Object By Means Of Additive ManufacturingADDITIVE INDUSTRIESFeb 21, 2023
Powder Spreading Quality Test Method And Additive Manufacturing DeviceXIAN BRIGHT LASERFeb 2, 2023
Gas Recirculation Device And System With SamePFEIFFER VACUUMOct 5, 2022
Plant For Additively Manufacturing Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSAug 5, 2022
Device For Additive Production Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSJul 25, 2022
Device And Method For Producing A Three-Dimensional ObjectEOS ELECTRO OPTICAL SYSTEMSJul 6, 2022
Apparatus For Additively Manufacturing Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSMay 31, 2022
Device For Additive Production Of Three-Dimensional ObjectsCL SCHUTZRECHTSVERWALTUNGSMay 18, 2022

Explore Nikon's recently opposed patents, revealing key competitive challenges and strategic patent disputes in the industry. Track oppositions filed by competitors to understand technology battlegrounds and assess potential risks.

Last updated on: Jul 9, 2026
Patent NumberPublication DateTitleTotal Oppositions
Jan 21, 2026Analysis Device, Microscope Device, Analysis Method, And Program2
Jun 25, 2025Microscope System1
Jan 3, 2024Apparatus And Method For Producing A Three-Dimensional Work Piece1
Nov 29, 2023Focusing Device, Microscope Device, Focusing Method, And Control Program1
Sep 27, 2023Optical Component And Method For Producing Same1
Jul 19, 2023Observing Apparatus And Observing Method1
May 31, 2023Measurement Probe Unit For Metrology Applications1
Dec 2, 2020Observing Device2
Nov 18, 2020Spectrum Observation Method And Spectrum Observation System2
Sep 26, 2018Profile Measuring Apparatus, Method For Manufacturing Structure, And Structure Manufacturing System2

Latest PTAB cases involving Nikon

Discover the latest PTAB cases involving Nikon, highlighting their recent legal challenges and patent disputes.

Last updated on: Jul 12, 2026
Proceeding NumberFiling DatePetitionerRespondentStatus

Get alerts for PTAB Cases involving Nikon

IPR2024-01372Aug 30, 2024NIKONOPTIMUM IMAGINGTerminated-Settled
IPR2024-01373Aug 30, 2024NIKONOPTIMUM IMAGINGTerminated-Settled
IPR2018-00686Mar 5, 2018NIKONCARL ZEISSInstitution Denied
IPR2018-00687Feb 26, 2018NIKONCARL ZEISSTerminated-Settled
IPR2018-00687Feb 26, 2018NIKONKIMTerminated-Settled
IPR2018-00688Feb 22, 2018NIKONCARL ZEISSTerminated-Settled
IPR2018-00688Feb 22, 2018NIKONKRESCHTerminated-Settled
IPR2018-00220Nov 21, 2017NIKONCARL ZEISSInstitution Denied
IPR2018-00227Nov 21, 2017NIKONCARL ZEISSInstitution Denied
IPR2015-00002Oct 1, 2014NIKONASML NETHERLANDSFinal Written Decision

Peer Comparison New

IP litigation analysis comparing Nikon with top 3 competitors. Includes complete PTAB case data and opposition data from 2018 onwards.

Last updated on: Jul 9, 2026
CompanyOppositions FiledOppositions FacedPTAB Cases FiledPTAB Cases Faced
NIKON - 1192
ASML NETHERLANDS - 1292
CARL ZEISS7053315
CARL ZEISS MICROSCOPY15 - 1 -