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Latest oppositions filed by Carl Zeiss Meditec

Explore patent oppositions filed by Carl Zeiss Meditec against competitors, revealing strategic technology disputes and market positioning. Monitor opposition details, timelines, and disputed innovations to understand competitive dynamics and IP enforcement strategy.

Patent NumberTitleApplicantOpposition Date
EP3805834Optical Imaging System And Corresponding Apparatus, Method And Computer ProgramLEICA INSTRUMENTS SINGAPORE PTESep 5, 2024
EP3805838Microscope And Related Apparatuses, Methods And Computer ProgramsLEICA INSTRUMENTS SINGAPORE PTESep 5, 2024
EP3607922Image Processing Device, Image Processing Method, And Image Processing ProgramSONYApr 19, 2023
EP3285107Surgical Microscope With Gesture Control And Method For A Gesture Control Of A Surgical MicroscopeLEICA INSTRUMENTS SINGAPORE PTEJan 27, 2022
EP3318226Clean Venturi AspirationTHISOct 6, 2021
EP2593707Retaining Device For An InstrumentSENSODRIVENov 6, 2018

Explore Carl Zeiss Meditec's recently opposed patents, revealing key competitive challenges and strategic patent disputes in the industry. Track oppositions filed by competitors to understand technology battlegrounds and assess potential risks.

Patent NumberGrant DateTitleTotal Oppositions
EP2805697May 15, 2024High-Precision Material Processing Device1
EP3354239Aug 24, 2022Producing Cut Surfaces In A Transparent Material By Means Of Optical Radiation1
EP3319569Jan 19, 2022Ophthalmologic Therapy Assembly For Processing A Surface In A Processing Volume Of A Transparent Material By Means Of Focused Radiation1
EP3363416Aug 11, 2021Device And Method For Producing Control Data For The Surgical Correction Of Defective Eye Vision1
EP2768447Sep 16, 2020Producing Cut Surfaces In A Transparent Material By Means Of Optical Radiation1
EP3056163Jul 8, 2020Visualization System1
EP2134247Dec 6, 2017Device And Method For Axial Length Measurement Having Expanded Measuring Function In The Anterior Eye Segment1
EP2367469Oct 25, 2017Device For Swept-Source Optical Coherence Domain Reflectometry2